Business Wire

61. Rudolph's Next-Generation PrecisionWoRx VX4 Extends The Capabilities Of Leading Probe Card Test And Analysis Tool
    7/15/2008
    Rudolph Technologies, Inc., a leading provider of process characterization equipment and software for both front-end and back-end inspection and metrology solutions, today announced the PrecisionWoRx™ VX4, the next generation of its market-leading probe card test and analysis tools
62. KTEI V7.1 Upgrade For Model 4200-SCS Semiconductor Characterization System Expands C-V, I-V, And Pulsed I-V Characterization
    7/15/2008
    Keithley Instruments, Inc., a leader in solutions for emerging measurement needs, has introduced Keithley Test Environment Interactive (KTEI) V7.1 for the company’s award-winning Model 4200-SCS Semiconductor Characterization System
63. Hana Micron Buys Verigy Port Scale RF Solution To Meet Customer Demand For Testing Wireless Consumer Devices
    7/10/2008
    Verigy, a premier semiconductor test company, today announced that Hana Micron Inc., a leading Korea-based company specializing in the assembly and test of semiconductor packages and modules, has selected the Verigy Port Scale RF solution for testing their IDM and fabless customers’ consumer wireless devices
64. Asahikasei EMD First To Select Teradyne's New UltraFLEX-HD Test System With UltraPin800 And UltraWave12G Instrumentation Suite
    7/10/2008
    Teradyne, Inc. announced today that Asahikasei EMD(AKEMD), the world’s premier supplier of audio ICs for professional and consumer markets, has purchased several new UltraFLEX-HD™ systems for testing RF SOC devices
65. National Instruments DIAdem 11.0 Expands Test Data Management And Visualization
    7/8/2008
    National Instruments today announced the release of DIAdem 11.0, the latest version of the interactive software for managing, analyzing and reporting test data. DIAdem 11.0 adds sensor data mapping for 3D CAD models to simplify the visualization of high-channel-count systems
66. CETECOM Expands Its MediaFLO Testing Capabilities With Equipment From Spirent Communications
    7/8/2008
    Spirent Communications plc (LSE:SPT), a global provider of performance analysis and service management solutions, and CETECOM Incorporated (USA) today announced that CETECOM has chosen Spirent FLO1-ATS automated test system for its MediaFLO /3G test lab in San Diego, Calif
67. Customized Test Solutions To Drive MEMS Test Equipment Market
    7/2/2008
    Frost & Sullivan will host a free telephone and web briefing on Wednesday, 9 July 2008 at 16.00 BST to provide industry participants with an overview of the study focusing on MEMS Test Equipment market
68. Ferdinand Braun Institute Places Order For The Accel-RF High Power RF Reliability Test System
    7/1/2008
    Accel-RF announces an order from the Ferdinand Braun Institute in Berlin, Germany for the new High Power Reliability (HiPR) RF Test System for GaN Devices