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Application Note: Importance Of Mismatch Tolerance For Amplifiers Used In Susceptibility Testing

Thu, 06 Sep 2007 14:18:00 GMT

This article focuses on the often overlooked issue of mismatch in RF systems, the harmful effects of even a modest amount of mismatch, and finally, how proper selection of the system amplifier can mitigate the ill effects of mismatch. Functioning as a key element in an EMC susceptibility system, the RF amplifier must be capable of dealing with extreme mismatches without compromising performance or reliability...

Color iQC

Tue, 07 Aug 2007 14:43:40 GMT

Color Quality Control Software

Datasheet: R&S FSU Spectrum Analyzer

Tue, 21 Aug 2007 19:19:00 GMT

The R&S�FSU spectrum analyzers are performance leaders in dynamic range, phase noise, level accuracy, and resolution bandwidth - all factors that are essential for the user's ability to design, characterize, and manufacture next generation wireless elements.

Solder-In Filters

Wed, 30 Jul 2003 15:17:00 GMT

Many designers have opted to semi-integrate feedthrus by soldering feedthrus directly into the housings. The solder-in feedthrus are available in a glass forward or reverse seal...

Technical Article: Immunity Testing For The CE Mark

Wed, 28 Jun 2006 17:45:00 GMT

By Rodger Gensel, AR
The legally prescribed test requirements for EMC standards in the EU are issued by CENELEC, the European Committee for Electrotechnical Standardization. CENELEC issues both Generic and Product standards. This article will focus on five of the European Standards from CENELEC used in the immunity portion of the standards, four of which are required by the generic standards for CE mark certification...

Product Brochure: R&S CMW500 Wideband Radio Communication Tester - RF Production Testing

Wed, 25 Jun 2008 08:45:00 GMT

The R&S CMW500 marks the entry of a new generation of test equipment from Rohde & Schwarz. It allows fast and precise production testing of current and future wireless devices from a basic mobile phone to the most sophisticated PDA.

Color Fastness Cabinets

Mon, 16 Jun 2008 17:48:00 GMT

The VeriVide Color Fastness grading cabinet (CF_60) provides perfect conditions for the grading and assessment of samples for color fastness, in accordance to standards and specifications for visual color evaluation including ASTM D1729, SAE J 361, AATCC Procedure Number 9, BS-950, AS-4004 DIN, JIS, ISO 3664 and retailer specifications

Application Note: High-Speed Downlink Packet Access (HSDPA): Challenges For UE Power Amplifier Design

Mon, 01 May 2006 15:10:00 GMT

This Application Note describes the HSDPA and HSUPA uplink channel structure. Challenges for UE power amplifier design are outlined, and guidelines how to use R&S measurement equipment for testing UE power amplifiers are provided.

Application Note: Importing Data In ARB, Custom Digital Modulation And RF List Mode

Mon, 01 May 2006 15:07:00 GMT

The foregoing application note is intended for everyone who desires to become more familiar with the use and upload of custom data in ARB, digital modulation and RF list mode. Particularly, this note describes the instruments R&S� SMU200A, R&S� SMJ100A, R&S� SMATE200A, R&S� AFQ100A and R&S� AMU200A and provides an overview of already available solutions as well as it gives hints for the writing of own applications

Application Note: Transfer Toolbox For Matlab For SMU200A,SMJ100A And SMATE200A

Mon, 01 May 2006 14:50:00 GMT

The R&S MATLAB� Toolkit for Signal Generators and Power Sensors provides routines for remote controlling these instruments. Additional MATLAB� scripts turn I/Q vectors into the Rohde & Schwarz waveform file format for use with an ARB. This application note describes the installation and use of the R&S MATLAB� Toolkit on Microsoft Widows and Linux based systems.

Rohde & Schwarz Enhances Test Platforms To Handle End-To-End Tests On Mobile Phones Under Field Conditions

Fri, 05 Mar 2010 19:32:28 GMT

Rohde & Schwarz is enhancing its R&S CONTEST test software by adding end-to-end tests on mobile phones under real-world receive conditions.

Instrument Systems Acquires X-Rite's Light Measurement Division

Thu, 04 Mar 2010 08:26:00 GMT

Munich-based Instrument Systems GmbH has taken over the light measurement division of X-Rite Inc., effective January 1, 2010.

QED Technologies Announces Implementation Of Its ASI Metrology System For Aspheres By Leibniz Institute For Surface Modification

Fri, 05 Mar 2010 03:44:30 GMT

QED Technologies, the pioneer and exclusive provider of Magnetorheological Finishing (MRF) and Subaperture Stitching Interferometry (SSI), announces implementation of one of its new Aspheric Stitching Interferometers (ASI) at the Leibniz Institute for Surface Modification (IOM) in Leipzig, Germany

New Procedure Could Speed Cell Phone Testing

Wed, 03 Mar 2010 14:07:00 GMT

By accurately re-creating the jumbled wireless signal environment of a city business district in a special indoor test facility, researchers at the National Institute of Standards and Technology (NIST) have shown how the wireless industry could lop hours off the process of testing the capabilities of new cellular phones.

Giga-tronics Supplies High Power Test Signals For Checking A Facility's Electronic Security

Wed, 03 Mar 2010 08:47:00 GMT

Giga-tronics announced recently that it is supplying equipment to provide high power test signals for checking a facility's electronic security.

Aeroflex Broadens Support For Low-Cost, High-Speed WLAN Manufacturing Test With New MIMO Capability

Wed, 03 Mar 2010 08:33:00 GMT

Aeroflex recently introduced support for MIMO (multiple-input/multiple-output) testing capabilities for its PXI 3000 Series manufacturing test system with the introduction of its new PXI 3061 module, a multiport RF combiner.

Rohde & Schwarz Launches Its First Four-Port Network Analyzer Up To 67 GHz

Wed, 03 Mar 2010 18:37:00 GMT

The high-end R&S ZVA67 vector network analyzer from Rohde & Schwarz is now also available as a four-port model. This is the first network analyzer on the market to feature four test ports for measurements up to 67 GHz.

Rohde & Schwarz Integrates TETRA Release 2 Data Service Enhancement Testing Into Its Comprehensive T&M Portfolio

Fri, 26 Mar 2010 04:05:00 GMT

Rohde & Schwarz is upgrading its portfolio of T&M equipment to provide test capabilities for the data service enhancements included in TETRA Release 2. The latest release of the TETRA standard is intended to increase the capacity of professional mobile radio networks

Auriga Measurement Systems Changes Name To Auriga Microwave

Mon, 01 Mar 2010 08:43:00 GMT

Auriga Measurement Systems, LLC recently announced it will be doing business as Auriga Microwave. The new name better signifies the Company's strength and direction.

Astronomically Large Lenses Measure The Age And Size Of The Universe

Mon, 01 Mar 2010 08:21:00 GMT

Using entire galaxies as lenses to look at other galaxies, researchers have a newly precise way to measure the size and age of the universe and how rapidly it is expanding, on a par with other techniques.

National Instruments Introduces Solution For Phase-Coherent RF Measurements

Tue, 02 Mar 2010 04:25:35 GMT

National Instruments (Nasdaq: NATI) today introduced new RF vector signal generators (VSGs) and vector signal analyzers (VSAs) in two-channel, three-channel and four-channel versions for multichannel multiple-input-multiple-output (MIMO) RF design and test applications

Fluke Networks Announces Industry's First Handheld Tool Offering Intuitive, Rapid Wi-Fi Troubleshooting

Mon, 01 Mar 2010 16:00:00 GMT

Fluke Networks today announced the AirCheck Wi-Fi Tester, a dedicated handheld tool that delivers quick and easy troubleshooting for today's increasingly complex wireless local area networks (WLAN). Offering simple, intuitive operation, the rugged new Wi-Fi tester can be learned and used in minutes by frontline IT professionals, even if they have little previous wireless network experience, and is an affordable option for every enterprise, large or small

Viper Optical Time Domain Reflectometer: FTE 7000 OTDR

Fri, 05 Feb 2010 15:25:00 GMT

The FTE-7000 Viper OTDR is the most affordable Handheld Optical Time Domain Reflectometer on the Market today with all of the features of more expensive units. Features such as Trace Overlay, Visual Fault Locator, Loss Test Set, Color Display, One Button Autotest and Event Analysis are included. These are features one would expect to find on units costing thousands more. This OTDR can be operated by the novice while at the same time appreciated by the seasoned user.

Wideband Radio Communication Tester Provides Flexibility In Development And Production

Wed, 24 Feb 2010 13:36:00 GMT

At the Mobile World Congress 2010, Rohde & Schwarz unveiled an extensive package of new features for the R&S CMW500 wideband radio communication tester launched in 2009. All the new features are aimed at delivering maximum flexibility for the mobile radio industry.

ABOV Semiconductor Purchases J750 For Microcontroller Testing

Wed, 24 Feb 2010 23:00:00 GMT

Teradyne, Inc.,announced that ABOV Semiconductor, a fabless microcontroller semiconductor company, selected the J750 test system for characterization and production test of its portfolio of 8-bit and 32-bit microcontrollers

Scatterometry - Measuring Ever-Smaller Chip Production

Wed, 24 Feb 2010 20:20:00 GMT

As computer chips rapidly continue to evolve, new technologies must be developed to closely monitor the fabrication process and guard against faults at a sub-microscopic level. More than 40 years ago Intel co-founder Gordon Moore predicted the capacity of computer chips would double every two years for a 10-year period. He was wrong about the time, but right about the rest. Despite frequent reports and predictions of its demise, Moore's law is still going strong today.

Datasheet: Hotpack Undercounter, Freestanding, And SpaceSaver Glassware Washer Accessories

Thu, 25 Feb 2010 04:15:00 GMT

Hotpack Under Counter Glassware Washers are engineered for durable, reliable and energy efficient operation. For laboratories with space restraints pick the Space Saver Double Stack Glassware Washer and put two Under Counter Glassware Washers together in a single vertical tower.

Datasheet: Hotpack Undercounter Glassware Washers

Thu, 25 Feb 2010 04:15:00 GMT

Agilent Technologies' Automated DisplayPort Compliance Test Solution Supports ROHM's DisplayPort Rx LSI

Tue, 23 Feb 2010 16:00:00 GMT

Agilent Technologies Inc. today announced that its DisplayPort compliance test solution supports automated testing of the ROHM's Receiver (Rx) IP cores for DisplayPort. The new Agilent test solution increases productivity and efficiency, and gives confidence and accuracy for chipset testing

Application Note: Updates On The New Release Of IEC 61000-4-3 Edition 3

Thu, 23 Feb 2006 19:24:00 GMT

The IEC 61000-4-3 has been used for many years as the basic test standard for testing to Radiated, electromagnetic field immunity testing in order to satisfy one of many European Union requirements for the CE mark. This standard is usually used in conjunction with a product standard that will specify this and other test standards detailing the requirements the product must meet. The product standard may give additional guidance on how this test standard is used, including test level severity and changes to procedure...

Application Note: Automotive 600V/m Radar Pulse Test Solution

Thu, 23 Feb 2006 19:09:00 GMT

By Jason Smith, Sr. Applications Engineer, AR
There are many hazardous electrical events in the environment that can have adverse effects on the systems of a vehicle, causing potentially unsafe situations. These events can be generated by "off-vehicle" as well as "on-vehicle" sources and can either be natural or man-made. To protect against these events automobile manufacturers have developed ElectroMagnetic Compatibility (EMC) standards to test electronic components and whole vehicles. One known manmade event is the Radar Pulse used by military and airports to track aircraft. This high intensity RF field is directed up into the sky but sometimes can be detected on the surface where it could possibly affect the electronics of an automobile...

High Performance Ethernet Analyzer Featuring Multi-Network Testing

Mon, 22 Feb 2010 06:26:00 GMT

GAO Instruments has released its portable 10/100/1000m Ethernet analyzer, an ideal solution for analyzing and troubleshooting Ethernet networks during the processes of construction or maintenance. It supports multi-network testing, bit error testing of ISO layer1-3 and comprehensive network monitoring

NIST Grants Awards For Recovery Act Fellowship Programs

Sat, 20 Feb 2010 04:02:00 GMT

The U.S. Commerce Department's National Institute of Standards and Technology (NIST) announced recently that it is awarding a total of $20 million to the University of Maryland and the University of Colorado to develop and implement NIST measurement science and engineering fellowship programs

Keithley's Ultra-Fast Current-Voltage System Combines Three Essential Characterization Capabilities In One Chassis

Thu, 18 Feb 2010 06:46:00 GMT

Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, today introduced the Model 4225-PMU Ultra Fast I-V Module, the latest addition to the growing range of instrumentation options for the Model 4200-SCS Semiconductor Characterization System

GL Announces Automated Network-Wide Voice Quality Monitoring

Thu, 18 Feb 2010 06:04:00 GMT

GL Communications Inc. announced today the release of their Automated Network-Wide Voice Quality Monitoring solutions - These offer a complete solution for monitoring voice quality over PSTN, VoIP, TDM, and Wireless telecom networks

Case Study: Century-Old Finlay's Future Looks Bright With X-Rite

Wed, 17 Feb 2010 05:40:00 GMT

Originally founded in Hartford CT at the end of the 19th century, Finlay is now in its 133rd year in business. Today, the award-winning company employs over 100 people and is one of the most successful and innovative printing and marketing solution firms in North America. Finlay's customers tend to be highly branded companies in a variety of markets including: education, corporate, retail point-of-sale, financial services and design. By X-Rite, Inc.

SP TechCare Validation Services

Tue, 10 Feb 2004 18:46:00 GMT

As the Service and Support arm for the SP Industries Equipment Manufacturing Divisions, SP TechCare is uniquely qualified to provide for all your validation needs.

Product Brochure: R&S FSH4/8 Handheld Spectrum Analyzer

Fri, 21 Nov 2008 17:49:00 GMT

The R&S�FSH spectrum analyzer is rugged, handy and designed for use in the field. Its low weight, its simple, well-conceived operation and the large number of measurement functions make it an indispensable tool for anyone who needs an efficient measuring instrument for outdoor work.

Datasheet: R&S FSH4/8 Handheld Spectrum Analyzer

Fri, 21 Nov 2008 17:49:00 GMT

Datasheet: Lightpath Analysis Software

Mon, 02 Nov 2009 14:04:16 GMT

Luna Technologies' Lightpath Analysis Software, in combination with our awarding-winning Optical Backscatter Reflectometer (OBR), is used to quickly and easily verify the physical-layer performance characteristics of fiber optic components, modules and cable assemblies.

Datasheet: Skew Measurements Using The OBR™

Mon, 02 Nov 2009 13:56:00 GMT

Skew measurements can now be made on multimode and/or single-mode fiber cable ribbons using a combination of Luna Technologies' user-friendly Software Development Kit (SDK) in conjunction with the Optical Backscatter Reflectometer and the highly scalable Fiber Optic Switch.

Datasheet: Distributed Sensing System: Model DSS 4300

Tue, 27 Oct 2009 04:58:00 GMT

Luna Technologies' Distributed Sensing System™ (DSS) 4300 is a fiber optic sensing tool for making distributed measurements of temperature and strain.

Datasheet: Precision Reflectometer: Model PR™ 4400

Tue, 27 Oct 2009 04:48:00 GMT

Luna Technologies' Precision Reflectometer: Model PR 4400 is the industry's cutting edge tool for measuring optical reflections as a function of distance. With a single scan, the PR 4400 quickly gives the user unprecedented optical module inspection and diagnostic capabilities to locate and troubleshoot connectors, fiber breaks, and more.

Datasheet: Tunable Laser With An Optical Fiber Coupled Output: Phoenix 1000 Swept Laser Module

Tue, 27 Oct 2009 05:12:00 GMT

MEMs-based, external cavity laser, based on the former Iolon 'Apollo' class of tunable lasers, offering low noise and precise tuning capability over the C-band.

Konica Minolta Photo Imaging U.S.A., Inc. - Instrument Systems Division - Spectrophotometers

Thu, 27 Jan 2005 05:00:00 GMT

Konica Minolta's Instrument Systems Division (ISD) is about measuring, matching, reproducing, and communicating Color and Light

Brochure: RF Power Amplifiers For EMC And General RF Testing

Tue, 19 Jan 2010 13:27:00 GMT

AR amplifiers and power-matched accessories are distinct in their ability to accommodate nearly every test level and methodology. Approximately 80% of the amplifiers in this brochure are completely immune to load VSWR. That means 100% of the power is delivered to the load 100% of the time. Our highest power amplifiers refuse to limit until VSWR exceeds 6.0:1 or 50% (of rated output) reflected power.

35 Watt CW, 4 to 8 GHz Microwave Power Amplifier

Tue, 17 Jan 2006 13:51:43 GMT

The Model 35S4G8A is a solid state, self-contained, air-cooled, broadband amplifier designed for applications where instantaneous bandwidth and high gain are required.