Test and Measurement.com Newsletters Newsletters http://www.testandmeasurement.com/ Wed, 03 Mar 2010 11:45:00 GMT 3.3.10 -- Scatterometry -- Measuring Ever-Smaller Chip Production 3.3.10 -- Test and Measurement.com Newsletter http://www.testandmeasurement.com/article.mvc/3310-Test-and-Measurementcom-Newsletter-0001?atc~c=906+s=779+r=001+l=a Wed, 03 Mar 2010 11:45:00 GMT 2.17.10 -- New IEEE 1149.7 Test And Debug Standard Expands And Improves JTAG Functionality 2.17.10 -- Test and Measurement.com Newsletter http://www.testandmeasurement.com/article.mvc/21710-Test-and-Measurementcom-Newsletter-0001?atc~c=906+s=779+r=001+l=a Wed, 17 Feb 2010 11:45:00 GMT 2.3.10 -- European Collaboration Breakthrough In Developing Graphene 2.3.10 -- Test and Measurement.com Newsletter http://www.testandmeasurement.com/article.mvc/2310-Test-and-Measurementcom-Newsletter-0001?atc~c=906+s=779+r=001+l=a Wed, 03 Feb 2010 11:45:00 GMT 1.20.10 -- Mirror Testing At NASA Breaks Superstitious Myths 1.20.10 -- Test and Measurement.com Newsletter http://www.testandmeasurement.com/article.mvc/12010-Test-and-Measurementcom-Newsletter-0001?atc~c=906+s=779+r=001+l=a Wed, 20 Jan 2010 11:45:00 GMT 1.6.10 -- Argonne Scientists To Control Attractive Force For Nanoelectromechanical Systems 1.6.10 -- Test and Measurement.com Newsletter http://www.testandmeasurement.com/article.mvc/1610-Test-and-Measurementcom-Newsletter-0001?atc~c=906+s=779+r=001+l=a Wed, 06 Jan 2010 11:45:00 GMT 12.16.09 -- Experimental Validation Tool For Cell Phone Forensics Developed 12.16.09 -- Test and Measurement.com Newsletter http://www.testandmeasurement.com/article.mvc/121609-Test-and-Measurementcom-Newsletter-0001?atc~c=906+s=779+r=001+l=a Wed, 16 Dec 2009 11:45:00 GMT 12.2.09 -- Record-Breaking Radio Astronomy Project To Measure Sky With Extreme Precision 12.2.09 -- Test and Measurement.com Newsletter http://www.testandmeasurement.com/article.mvc/12209-Test-and-Measurementcom-Newsletter-0001?atc~c=906+s=779+r=001+l=a Wed, 02 Dec 2009 11:45:00 GMT 11.18.09 -- New Nanocrystalline Diamond Probes Overcome Wear 11.18.09 -- Test and Measurement.com Newsletter http://www.testandmeasurement.com/article.mvc/111809-Test-and-Measurementcom-Newsletter-0001?atc~c=906+s=779+r=001+l=a Wed, 18 Nov 2009 11:45:00 GMT 11.4.09 -- Argonne Dedicates New Microscopy Facility At Center For Nanoscale Materials 11.4.09 -- Test and Measurement.com Newsletter http://www.testandmeasurement.com/article.mvc/Argonne-Dedicates-New-Microscopy-Facility-At-0001?atc~c=906+s=779+r=001+l=a Wed, 04 Nov 2009 13:00:00 GMT 10.21.09 -- GOEPEL Electronic Expands To China 10.21.09 -- Test and Measurement.com Newsletter http://www.testandmeasurement.com/article.mvc/102109-Test-and-Measurementcom-Newsletter-0001?atc~c=906+s=779+r=001+l=a Wed, 21 Oct 2009 12:00:00 GMT 10.7.09 -- Femtoseconds Lasers Help Formation Flying 10.7.09 -- Photonics Online Newsletter http://www.testandmeasurement.com/article.mvc/10709-Photonics-Online-Newsletter-0001?atc~c=906+s=779+r=001+l=a Wed, 07 Oct 2009 12:15:00 GMT 9.30.09 -- New NIST Nano-Ruler Sets Some Very Small Marks 9.30.09 -- Test and Measurement.com Newsletter http://www.testandmeasurement.com/article.mvc/93009-Test-and-Measurementcom-Newsletter-0001?atc~c=906+s=779+r=001+l=a Wed, 30 Sep 2009 12:00:00 GMT 9.23.09 -- Rohde & Schwarz And Radiocomp Partner To Demonstrate CPRI Competence 9.23.09 -- Test and Measurement.com Newsletter http://www.testandmeasurement.com/article.mvc/92309-Test-and-Measurementcom-Newsletter-0001?atc~c=906+s=779+r=001+l=a Wed, 23 Sep 2009 12:00:00 GMT 9.16.09 -- Prototype NIST Method Detects And Measures Elusive Hazards 9.16.09 -- Test and Measurement.com Newsletter http://www.testandmeasurement.com/article.mvc/91609-Test-and-Measurementcom-Newsletter-0001?atc~c=906+s=779+r=001+l=a Wed, 16 Sep 2009 12:00:00 GMT 9.9.09 -- SUSS MicroTec Launches 300mm Test Solution For 3-D Integration 9.9.09 -- Test and Measurement.com Newsletter http://www.testandmeasurement.com/article.mvc/9909-Test-and-Measurementcom-Newsletter-0001?atc~c=906+s=779+r=001+l=a Wed, 09 Sep 2009 12:00:00 GMT 9.2.09 -- Researchers Advance Peridynamic Theory Research To Help Make Electronics More Reliable 9.2.09 -- Test and Measurement.com Newsletter http://www.testandmeasurement.com/article.mvc/9209-Test-and-Measurementcom-Newsletter-0001?atc~c=906+s=779+r=001+l=a Wed, 02 Sep 2009 12:00:00 GMT 8.26.09 -- Anritsu Introduces Handheld Analyzers For Field Testing 2G, 3G, And WiMAX Networks 8.26.09 -- Test and Measurement.com Newsletter http://www.testandmeasurement.com/article.mvc/82609-Test-and-Measurementcom-Newsletter-0001?atc~c=906+s=779+r=001+l=a Wed, 26 Aug 2009 12:00:00 GMT 8.19.09 -- Novel Temperature Calibration Improves NIST Microhotplate Technology 8.19.09 -- Test and Measurement.com Newsletter http://www.testandmeasurement.com/article.mvc/81909-Test-and-Measurementcom-Newsletter-0001?atc~c=906+s=779+r=001+l=a Wed, 19 Aug 2009 12:00:00 GMT 8.12.09 -- National Instruments And Tektronix Develop PXI Digitizer 8.12.09 -- Test and Measurement.com Newsletter http://www.testandmeasurement.com/article.mvc/81209-Test-and-Measurementcom-Newsletter-0001?atc~c=906+s=779+r=001+l=a Wed, 12 Aug 2009 12:00:00 GMT 8.5.09 -- NI Launches LabVIEW 2009 For Emerging Applications 8.5.09 -- Test and Measurement.com Newsletter http://www.testandmeasurement.com/article.mvc/8509-Test-and-Measurementcom-Newsletter-0001?atc~c=906+s=779+r=001+l=a Wed, 05 Aug 2009 12:00:00 GMT