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3.3.10 -- Scatterometry -- Measuring Ever-Smaller Chip Production

March 3, 2010

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Industry News

Scatterometry – Measuring Ever-Smaller Chip Production
NIST Grants Awards For Recovery Act Fellowship Programs
New LTE Applications Target 4G System-Level Designers
National Instruments Introduces Solution For Phase-Coherent RF Measurements
NanoInk Installs Nanofabrication System At The University Of Strathclyde's Centre For Molecular Nanometrology
High Performance Ethernet Analyzer Featuring Multi-Network Testing
Wideband Radio Communication Tester Provides Flexibility In Development And Production
ABOV Semiconductor Purchases J750 For Microcontroller Testing
GL Announces Automated Network-Wide Voice Quality Monitoring
Fluke Networks Announces Handheld Tool Offering Intuitive, Rapid Wi-Fi Troubleshooting
Keithley's Current-Voltage System Combines Three Essential Characterization Capabilities In One Chassis
Aeroflex Delivers TM500 Test Mobile To China Academy Of Telecommunications Research For TD-LTE Trials
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