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8.18.10 -- Researchers Successfully Test New Alternative To Traditional Semiconductors

August 18, 2010

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Industry News

Researchers Successfully Test New Alternative To Traditional Semiconductors
New Approach To Wafer-Level Unattended Over-Temperature Test Reduces Test Time And Increases Throughput
National Instruments Introduces X Series Multifunction DAQ For USB
Agilent Technologies Introduces Industry's First GDDR5 Compliance Test Tools For Oscilloscopes
JDSU Announces First-Ever Jitter Measurement Solution For Synchronous Ethernet
Anritsu Company Introduces First Handheld Spectrum Analyzer With Frequency Coverage Up To 43 GHz
GAO Instruments Launches Handheld Multi-Function ADSL2+ Tester
Advanced Test Equipment Rentals Announces Availability Of Multiple Amplifiers Meeting Updated MIL-STD-461E/F
EXFO Announces Major Performance Enhancements To Its 10M To 10G Ethernet, OTN And SONET/SDH Test Modules
Specialized Products Company Introduces CT100 COAXtracker And Coax Mapper Tester
European Carrier Deploys XTT 5000 Handheld Test Solution From Sunrise Telecom
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