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| Top News Stories | National Instruments Acquires IOtech
National Instruments announced that it has acquired the operating assets of IOtech Inc., a provider of PC-based data acquisition and instrumentation products. Terms of the acquisition were not disclosed...
| Fairchild Deploys Advantest Tester For Wafer-Probe Application
Advantest Corporation announced that Fairchild Semiconductor has selected the Advantest T6573 system-on-chip (SoC) platform for processing high-volume serializer/deserializer (SerDes) ICs used in consumer and ultra portable applications...
| FormFactor Selected By Tera Probe As Strategic Wafer Test Solution Provider
FormFactor, Inc. announced that Tera Probe Inc. has chosen FormFactor as its strategic partner for wafer probe card technology. Tera Probe, a testing service venture formed by Advantest Corporation, Kingston Technology, Powertech and Elpida Memory, Japan's leading global supplier of dynamic random access memory (DRAM), brings together its founders' respective test equipment, assembly and testing services, memory products and wafer technology and now FormFactor wafer probe solutions to serve Elpida and other semiconductor manufacturers...
| ASSET Tool Validates Design-For-Test Features
The new DFT Analyzer from ASSET InterTech Inc. reduces manufacturing and test costs by validating the boundary-scan design-for-test (DFT) features in a circuit board design before any prototypes are assembled. In addition, DFT Analyzer determines the extent of a design's boundary-scan test coverage and recommends changes that would increase coverage...
| Tanisys Receives Patent Approval
Tanisys Technology, Inc. recently received approval for its latest test related patent. The patent, titled "Method and System for Distributed Testing of Electronic Devices," is Tanisys' 16th patent granted by the U.S. Patent and Trademark Office...
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| Featured Products | Comparators And Sinewave Converters
Stand alone Hi-speed dual channel Comparator modules from Pulse Research Lab detect sinewave and small signals (as small as 10 mV) and convert them to logic-level outputs...
|  | Site Master Cable And Antenna Analyzer S251C
Covering the 625 MHz to 2500 MHz frequency band, the Site Master S251C site management tool is designed to accurately locate and identify cable and antenna system faults and conduct isolation and gain measurements...
|  | Radiated Susceptibility, Conducted Immunity, And Emissions Test Software
The Model SW1006 Radiated Susceptibility; Conducted Immunity, and Emissions Test software from AR Worldwide provides automated immunity and emissions testing and report generation for all types of users from corporate to professional test laboratories...
|  | Spectrolino
The Spectrolino spectrophotometer is a handheld tethered spectrophotometer ideal for applications which need to combine a high level of accuracy with the lowest possible cost...
|  | Light Source Colorimeter
The CS-100A is a compact, lightweight tristimulus colorimeter for non-contact measurements of light sources and emissive displays. The 1 acceptance angle and TTL (through-the-lens) viewing system enable accurate targeting of the subject...
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| Featured Download | | Application Note: Laser Vibrometry Helps To Improve Microstructure Simulations | | Computer simulation is essential to the development of MEMS devices.
Simulation models are tested and refined through comparisons with precise experimental data. The data validating the model and showing the mechanical response of the MEMS structure is easily acquired through the combination of a Polytec Laser Vibrometer and a Wafer Probe Station... |
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| Consulting Services | | ProSavvy brings clients with projects together with consultants who have the right expertise. We also provide consultants the ability to access project opportunities. Visit ProSavvy and post your project today! |
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| Training Resources | | Thinking About Continuing Your Education?
Let us help you find the right school for you. Whether you would like to get an Associate's Degree, Bachelor's Degree or Master's Degree we can help you pinpoint which schools to choose from. For further details, visit HERE |
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| Trade Publications | | Browse from the extensive list of complimentary trade publications. Visit HERE for more information. |
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