Articles

Varian Semiconductor Equipment Associates (Gloucester, MA) announced that George W. Chamillard, chairman and chief executive of Teradyne, Inc., has been elected a member of its Board of Directors. Chamillard has been CEO of Teradyne since 1997 and assumed the additional office of chairman in June 2000. An engineer by profession, he has been with Teradyne since 1984.

Chamillard is a director of the Semiconductor Equipment and Materials Institute (SEMI) and a director of the Semiconductor Industry Suppliers Association (formerly, SEMI/SEMATECH). He is also vice chairman of the Massachusetts High Technology Council, a director of the Center for Quality of Management and a member of the Governor's Board of Economic Advisors for the Commonwealth of Massachusetts. He sits on the Board of Corporators of the Wentworth Institute and serves on the Corporation Visiting Committee for the Engineering Systems Division of the Massachusetts Institute of Technology as a Presidential Nominee. He is also a director of Manufacturer's Services Limited. Chamillard received both bachelor of science and masters of business administration degrees from Northeastern University.

Teradyne is a global supplier of automatic test equipment, related software, and high performance interconnection systems for the electronics, telecommunications, and Internet industries. Teradyne products are used to test semiconductors, circuit assemblies, telephone lines, and broadband networks. Teradyne's backplane assemblies and high-density connectors are used in the communications and computing systems central to the Internet infrastructure

Varian Semiconductor Equipment Associates is a producer of ion implantation equipment used in the manufacture of semiconductors. The company operates from three manufacturing sites and 26 worldwide offices.

Varian Semiconductor Equipment Associates, Tel: 978-282-2005.

Teradyne Inc., Assembly Test Group, 2625 Shadelands Drive, Walnut Creek, CA 94598. Tel: 925-932-6900; Fax: 925-934-0540.

Edited by Paul O'Shea
Managing Editor, TestandMeasurement.com

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