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Teradyne Inc., Assembly Test Group announced the new J750k test system with an entry level price of $99,000. The J750k was designed to reduce the cost of test without compromising production efficiency, flexibility, or reliability. Available in Q1 2001, the J750k basic configuration starts with 64 pins at 33MHz and can be expanded up to 256 pins at 66MHz. As test requirements increase, the system may be upgraded to higher pin counts and speed with field hardware and software upgrades. The J750k may also be configured with system options, like the mixed-signal or memory test options, to address the variation of testing needs.

According to the company the J750k achieves over 95% parallel test efficiency and its zero footprint design allows for more efficient use of production floor space to reduce cost of ownership. The system also features IG-XL test software, the semiconductor ATE industry's first test development suite combining the power and performance of the latest PC technology and Windows NT operating system with the familiarity of standard Windows productivity tools, like Microsoft Excel and Visual Basic. To learn more about the J750k, go to the ITD website at www.teradyne.com/integra.

The J750k is available for shipment mid-Q1 2001. U.S. pricing for the J750k starts at $99,000 for a basic configuration of 33 MHz, 64 pin channel board with 1 Meg of memory. The system can be configured with up to 256 pins and may be upgraded to a 512 pin J750 configuration with the purchase of additional hardware and software enhancements.

Teradyne provides automated testing for the electronics, communications, and software industries. Its products and services address the test requirements of a broad range of semiconductors, electronic assemblies, telephone access networks, and software applications.

Teradyne. Tel: 781-999-8173.

Edited by Paul O'Shea
Managing Editor, TestandMeasurement.com