Teradyne Introduces The IP750Ex For Image Sensor Device Test
NORTH READING, Mass.--(BUSINESS WIRE)--Teradyne, Inc. (NYSE: TER) announced that Hynix Semiconductor, Inc., Icheon-si, Kyoungki-do Korea, has launched the production of their first CMOS image sensor using the new Teradyne IP750Ex™ test system for wafer testing.
The IP750Ex is an extension of Teradyne's successful J750™ platform, which has more than 2,800 systems installed worldwide. It is designed specifically for image sensor test, and can be easily upgraded from its predecessor systems, the IP750 and IP750EP™ (EMP) which have more than 730 testers installed worldwide. It is also upgradeable from the J750, making it one of the most versatile testers available. Multiple customers are already using the IP750Ex in production, achieving lower cost-of-test with higher parallel testing and improved total test time capability.
The IP750Ex is designed to cover next-generation complex devices with speeds of 200MHz and up to 32M pixels, by providing 32 sites of parallel test, centralized DSP architecture with Infiniband data transfer for higher throughput, SOC testing capability, and an analog option for CCD or DSLR testing. For more information on the IP750Ex, please visit: http://www.teradyne.com/ip750/
"It's exciting to launch the IP750Ex with such clear differentiators that make a real difference on the test floor," said Hirofumi Adachi, product manager, Teradyne. "We've designed an image sensor test system with a dual core CPU and per site DSP architecture with true parallel data processing test flow, combined with 10Gbps data transfer per site, to provide parallel test capability for up to 32 sites to ensure our customers the lowest cost of test per site. Using the J750 test head, IP750Ex provides a small footprint, yet it delivers powerful technical and performance advantages that will serve test needs now and well into the future."
About the IP750 Series
The IP750 series achieves superior performance and low test cost with high throughput, with up to 32 sites in parallel, broad device coverage for low to high speed CCD and CMOS sensors, analog and digital capture, and is fully integrated with an internal illuminator and external illuminators from major illuminator suppliers.
Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment used to test complex electronics used in the consumer electronics, automotive, computing, telecommunications, and aerospace and defense industries. In 2007, Teradyne had sales of $1.1 billion and currently employs about 3,600 people worldwide. For more information, visit www.teradyne.com. Teradyne (R) is a registered trademark of Teradyne, Inc. in the U.S. and other countries. All product names are trademarks of Teradyne, Inc. (including its subsidiaries).
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