Current Headlines

  1. GL Announces Enhanced T1E1 Line Monitoring, Test, And Diagnostic System
    6/17/2013

    GL Communications Inc. a leader in providing PC-based test, analysis and simulation products and consulting services to the worldwide telecommunications industry, announced today enhanced T1 E1 Line Monitoring, Test and Diagnostic System

  2. Polar Upgrades Atlas Si SET2DIL Test System
    6/17/2013

    Polar Instruments announces that its Atlas Si SET2DIL insertion loss test system will be upgraded to support Bidirectional SET2DIL from June 2013

  3. IEEE 1149.1-2013 Designed To Slash Electronics Industry Costs By Allowing Test Re-Use Throughout Integrated Circuit Lifecycle
    6/17/2013

    IEEE, the world's largest professional organization advancing technology for humanity, recently announced IEEE 1149.1-2013 “Standard for Test Access Port and Boundary-Scan Architecture” 

  4. UL Expands Zhaga Testing Capabilities For LED Light Source Interchangeability
    6/14/2013

    UL (Underwriters Laboratories), a global safety science leader, announced today it has been named an authorized testing laboratory for three new Zhaga Books; Zhaga Interface Specification Book 4: High-intensity LED light engines, Zhaga Interface Specification Book 7: Indoor light engines with separate electronic control gear and Zhaga Interface Specification Book 8: Socketable LED light engine with integrated control gear (85 mm base)

  5. TraceSpan Launches GPON Tracer™ - The World's First Handheld GPON Tester
    6/13/2013

    TraceSpan™ Communications, a leader in broadband analysis and monitoring solutions, announced today the release of GPON Tracer™ 380, the first and only handheld tester for on-site GPON network monitoring and troubleshooting

  6. Synopsys Unveils New Synthesis-Based Test Technology Delivering Up To 3X Higher Compression
    6/11/2013

    Synopsys, Inc. (Nasdaq: SNPS), a global leader providing software, IP and services used to accelerate innovation in chips and electronic systems, today unveiled a new, innovative test technology to further reduce the cost of testing silicon devices by delivering up to 3x higher test compression and minimizing the time required to test each silicon die

  7. New Release Of Mobile Labs’ deviceConnect Provides Performance Enhancements For More Comprehensive Manual Mobile Application Testing Support, Custom Control Support For Automation
    6/11/2013

    Mobile Labs LLC, a leading provider and innovator of cross-platform mobile application testing solutions, recently announced the latest version of deviceConnect, the private, internal device cloud that securely manages mobile devices, users, and apps in corporate test labs

  8. Keynote Now Enables UFT Users To Test On Real And Emulated Mobile Devices
    6/11/2013

    Keynote, the global leader in Internet and mobile cloud testing & monitoring, recently announced expanded integration of Keynote MITE with the leading automated functional testing platform – Unified Functional Testing (UFT), an HP product. Specifically, Keynote has introduced MITE Enterprise for UFT – a new product that brings the built-in MITE library of over 2,200 emulated devices into the UFT testing environment, greatly improving the efficiency for executing test cases run by mobile Web developers

  9. Tektronix Showcases New And Enhanced Optical Test Solutions At ECOC 2013
    6/10/2013

    Tektronix, the world's leading manufacturer of oscilloscopes, announced recently that the company will be showcasing a wide-range of optical test and measurement products at ECOC 2013 (Stand 638, Hall N8-N10), which takes place from 23.-25.09.2013 in London, UK

  10. Solar Press And FOM Technologies Announce Equipment Distribution Agreement
    6/10/2013

    Organic Photovoltaic (OPV) technology developer Solar Press has entered into a distribution agreement with specialist equipment company FOM Technologies for the sale of its unique, high performance fabrication and test equipment for functional materials research