Product/Service

LTX 77/90 Test System

Source: MV Technical Sales
The LTX 77/90 Test System is a modular test system directed at the testing of linear IC's as well as devices that combine both linear and digital circuitry on the same chip
The LTX 77/90 Test System is a modular test system directed at the testing of linear IC's as well as devices that combine both linear and digital circuitry on the same chip.

The TS80 is the master test station in the LTX 77/90 modular test system. The TS80 executes programmed commands from the CPU to perform high-speed, linear and analog/digital device testing which are tailored to the specific needs of the customer.

The TS88 succeeds the TS 80 as the master test station in the LTX 77/90 modular test system. The TS88 has all the capabilities of the TS80, but offers more flexibility and performance to meet the expanding needs of semiconductor testing.

The CX80 is an optional addition to the LTX 77/90 Test System. It contains testing units that provide RF signal generation/measurement, stereo signal generation, and video stimulus/measurement for testing consumer-oriented audio and video electronic devices.

The DX90 Digital Extension is also an optional addition to the LTX 77/90 Test System which extends the system into the high speed digital domain. The digital extension provides thorough, accurate, and high speed testing of mixed-technology devices including codecs, digital filters, analog processors, audio digitizing circuits, and digital communications devices.

MV Technical Sales, 5621 Palmer Way, Carlsbad, CA 92008. Tel: 760-930-8950; Fax: 760-930-9329.