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Z1803 Power-Off In-Circuit Tester
Teradyne Inc., Assembly Test Group
The Z1803 power-off in-circuit tester is designed to inspect analog and digital SMT boards for users who do not need full-fledged digital pattern (backdrive) tests
The Z1803 power-off in-circuit tester is designed to inspect analog and digital SMT boards for users who do not need full-fledged digital pattern (backdrive) tests. Featuring WaveScan vectorless test system to detect VLSI and ASIC pin opens, the tester delivers the high fault coverage, fast throughput and short programming cycle times. It is field-upgradable to full digital, boundary-scan and product function test for test strategy flexibility. Power-off analog in-circuit test of passives and shorts
Standard MultiScan vectorless test system for diagnosing device pin opens
Open mechanical architecture for rapid integration into automated SMT lines
Complete program generation and test validation tools.
Real-time process monitoring/alarms with ProcessWatch
Open system architecture with field upgradability for digital in-circuit, boundary-scan and product function test
Additional features include:
Teradyne Inc., Assembly Test Group, 2625 Shadelands Dr., Walnut Creek, CA 94598. Tel: 925-932-6900 or 1-800-227-1620; Fax: 925-934-0540.
