Products and Services

The Z1884VP is the most cost-effective solution available for testing large boards with high node counts. The Z1800-Series' non-multiplexed architecture provides a true high channel count much more cost-effectively than combinational testers designed with multiplexed channels. The non-mulitplexed architecture of the Z1884VP allows Teradyne to deliver up to 5120 driver channels at a price significantly less than that of multiplexed testers.

Full compatibility with other Z1800-Series software, programs, and fixtures lets you use the Z1884VP to test boards with smaller node counts, expanding test capacity. Based on the Z1800-Series architecture, the Z1884VP can be configured with all available Z1800- Series features and options. The Z1884VP high-channel-count system provides the proven technology, high fault coverage, fast programming cycle time, and low operating costs of the Z1800-Series to manufacturers who need to test large boards with high-pin-count devices.

Z1884VP features include:

• Up to 5120 analog/digital, non- multiplexed driver channels.
  
• Ergonomic handling of large boards and fixtures through electrical tilt to ensure easy access for loading and unloading.
  
• Standard MultiScan vectorless test system for diagnosing device pin opens.
  
• Vector Performance system for pattern test with VLSI and boundary scan.
  
• Real-time process monitoring/alarms with ProcessWatch.
  
• Built-in upgrade path to practical Single- Stage Test using IEEE/VXI instrumentation.

Teradyne Inc., Assembly Test Group, 2625 Shadelands Dr., Walnut Creek, CA 94598. Tel: 925-932-6900 or 1-800-227-1620; Fax: 925-934-0540.