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    <title>Test and Measurement.com News</title>
    <description>News Articles</description>
    <link>http://www.testandmeasurement.com/</link>
    <pubDate>Thu, 26 Jan 2012 11:18:00 GMT</pubDate>
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      <title>EXFO Brings Unmatched Cloud And Mobile Backhaul Service Reliability With EtherSAM Burst Testing</title>
      <description>EXFO Inc. announced recently the addition of burst testing functionalities to its award-winning Ethernet field-testing instruments</description>
      <link>http://www.testandmeasurement.com/article.mvc/EXFO-Brings-Unmatched-Cloud-And-Mobile-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Thu, 26 Jan 2012 11:18:00 GMT</pubDate>
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      <title>Gamma Scientific Introduces New Spectrometer For Quick And Easy LED Testing</title>
      <description>Gamma Scientific, a pioneer in light measurement instrumentation since 1961, has developed a low-cost spectrometer to provide quick and accurate testing for LEDs</description>
      <link>http://www.testandmeasurement.com/article.mvc/Gamma-Scientific-Introduces-New-Spectrometer-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Thu, 26 Jan 2012 10:56:00 GMT</pubDate>
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      <title>New Keithley Semiconductor Software Expands Support For Reliability/High Power Device Test</title>
      <description>Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has upgraded the capabilities of its Automated Characterization Suite (ACS) Test Environment</description>
      <link>http://www.testandmeasurement.com/article.mvc/New-Keithley-Semiconductor-Software-Expands-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Wed, 25 Jan 2012 14:00:00 GMT</pubDate>
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      <title>National Instruments Announces Test Solution For 802.11ac WLAN</title>
      <description>National Instruments recently announced early access support for testing next-generation 802.11ac WLAN chipsets and devices. This announcement exemplifies how NI's modular, software-defined wireless test platform continually expands to address the latest cellular and wireless connectivity standards including 802.11ac</description>
      <link>http://www.testandmeasurement.com/article.mvc/National-Instruments-Announces-Test-Solution-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Wed, 25 Jan 2012 11:12:00 GMT</pubDate>
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      <title>Sequans Communications Certifies The R&amp;S CMW500 Wideband Radio Communication Tester For The Alignment Of Its LTE Chipsets</title>
      <description>Sequans Communications, a leading 4G chip maker, now uses Rohde &amp; Schwarz test equipment to align its new generation LTE chipsets. The jointly-developed test solution is built around the multi-standard, market-leading R&amp;S CMW500 radio communication tester</description>
      <link>http://www.testandmeasurement.com/article.mvc/Sequans-Communications-Certifies-The-RS-0002?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Tue, 24 Jan 2012 11:45:00 GMT</pubDate>
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      <title>Agilent Technologies Introduces Industry's First Reference Clock Multiplier For Receiver Test</title>
      <description>Agilent Technologies Inc. recently announced the industry's first reference clock multiplier. </description>
      <link>http://www.testandmeasurement.com/article.mvc/Agilent-Technologies-Introduces-Industrys-0014?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Tue, 24 Jan 2012 09:35:00 GMT</pubDate>
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      <title>New MK52 Negative-Stiffness Optical Vibration Isolation Table</title>
      <description>Minus K Technology, a leading manufacturer of vibration isolation products has partnered with Kinetic Systems, Inc. in designing a new, versatile, ultra-low natural frequency optical table isolation system. </description>
      <link>http://www.testandmeasurement.com/article.mvc/New-MK52-Negative-Stiffness-Optical-Vibration-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Mon, 23 Jan 2012 05:21:00 GMT</pubDate>
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      <title>Konica Minolta Sensing Launches New CL-500A Illuminance Spectrophotometer</title>
      <description>Konica Minolta Sensing Americas, Inc. (KMSA), the worldwide leader in the industrial measurement of color, light and 3D shape, announces the launch of its newest light measurement product, the CL-500A Illuminance Spectrophotometer.</description>
      <link>http://www.testandmeasurement.com/article.mvc/Konica-Minolta-Sensing-Launches-New-CL-500A-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Fri, 20 Jan 2012 06:17:00 GMT</pubDate>
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      <title>LeCroy Announces 8 And 12-Port SPARQ Models For Signal Integrity Network Analysis </title>
      <description>LeCroy Corporation, a leading supplier of oscilloscopes, serial data test solutions and network analyzers, announces the availability of 8 and 12-port models of the SPARQ series of signal integrity network analyzers</description>
      <link>http://www.testandmeasurement.com/article.mvc/LeCroy-Announces-8-And-12-Port-SPARQ-Models-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Tue, 17 Jan 2012 11:24:00 GMT</pubDate>
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      <title>Anritsu Introduces Digital Broadcast BER Testing Capability For Spectrum Master And Cell Master Handheld Analyzers</title>
      <description>Anritsu Company introduces ISDB-T and DVB-T/H bit error rate (BER) measurement options for its MS2712E/MS2713E Spectrum Master handheld spectrum analyzers and MT8212E/MT8213E Cell Master base station analyzers</description>
      <link>http://www.testandmeasurement.com/article.mvc/Anritsu-Introduces-Digital-Broadcast-BER-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Tue, 17 Jan 2012 11:03:00 GMT</pubDate>
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      <title>Agilent Technologies Introduces Seven High-Power Modules For Modular Power System</title>
      <description>Agilent Technologies Inc. recently introduced seven high-power modules for its popular N6700 modular power system. The new modules expand the ability of test-system integrators and R&amp;D engineers to deliver multiple channels of high power (up to 500 watts) to devices under test.</description>
      <link>http://www.testandmeasurement.com/article.mvc/Agilent-Technologies-Introduces-Seven-High-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Tue, 17 Jan 2012 09:05:00 GMT</pubDate>
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      <title>Konica Minolta 3D Scanning Labs Expands Its Services To Include 3D Printing</title>
      <description>Konica Minolta 3D Scanning Labs announced recently its new rapid prototyping service. The company is now offering 3D printing services with the addition of 3D Systems' Projet&amp;trade; HD 3000 3D Production System.</description>
      <link>http://www.testandmeasurement.com/article.mvc/Konica-Minolta-3D-Scanning-Labs-Expands-Its-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Mon, 16 Jan 2012 05:02:00 GMT</pubDate>
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      <title>Southern Cross Selects JDSU To Ensure Quality 10G, 40G And 100G Networks </title>
      <description>JDSU (NASDAQ: JDSU) (TSX: JDU) announced today that Southern Cross Cable Network selected JDSU's T-BERD/MTS-8000 V2 40 G/100 G Transport Module to help ensure the non-interrupted delivery of high-bandwidth services over its high-speed submarine, trans-Pacific cable infrastructure</description>
      <link>http://www.testandmeasurement.com/article.mvc/Southern-Cross-Selects-JDSU-To-Ensure-Quality-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Thu, 12 Jan 2012 07:08:00 GMT</pubDate>
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      <title>EXFO Redefines WDM Testing And Network Optimization With WDM-Aware Technology</title>
      <description>EXFO Inc. announced recentlhy the addition of WDM-Aware testing capabilities to its FTB-5240S/B-P Optical Spectrum Analyzers, together with additional industry-leading features such as referencing, on-graph peak detection level and SCPI commands</description>
      <link>http://www.testandmeasurement.com/article.mvc/EXFO-Redefines-WDM-Testing-And-Network-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Thu, 12 Jan 2012 06:17:00 GMT</pubDate>
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      <title>Rohde &amp; Schwarz Drive Test Solution Now Offers Complete MIMO Measurements In Real LTE Networks   </title>
      <description>MIMO technology can increase the capacity of LTE networks. The latest R&amp;S ROMES software version for the proven drive test solution from Rohde &amp; Schwarz allows network operators and infrastructure manufacturers to collect important MIMO data during a drive test.</description>
      <link>http://www.testandmeasurement.com/article.mvc/Rohde-Schwarz-Drive-Test-Solution-Now-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Wed, 11 Jan 2012 06:24:00 GMT</pubDate>
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      <title>Tektronix Adds New Comprehensive High-Speed Serial Protocol Test Platform </title>
      <description>Tektronix, Inc., a leading supplier of test, measurement, and monitoring products and solutions, today introduced a new comprehensive protocol test platform that allows engineers to analyze, stimulate, stress and characterize high-speed serial links -- with support for speeds up to 10Gb/s</description>
      <link>http://www.testandmeasurement.com/article.mvc/Tektronix-Adds-New-Comprehensive-High-Speed-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Tue, 10 Jan 2012 10:27:00 GMT</pubDate>
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      <title>Reliable DDS Function Generator Launched</title>
      <description>GAO Instruments is offering its DDS function generator which is suitable for many general-purpose tests and bench applications such as in development, testing and repair of electronic equipment</description>
      <link>http://www.testandmeasurement.com/article.mvc/Reliable-DDS-Function-Generator-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Tue, 10 Jan 2012 10:13:00 GMT</pubDate>
    </item>
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      <title>Shenick Leads The Market With First Multi-Hypervisor Virtual Test And Measurement Solution</title>
      <description>Shenick Network Systems, provider of per-flow IP communication test and performance measurement solutions, today announced that it is leading the market with an IP test and measurement solution that can operate in a multi-hypervisor environment</description>
      <link>http://www.testandmeasurement.com/article.mvc/Shenick-Leads-The-Market-With-First-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Mon, 09 Jan 2012 14:30:00 GMT</pubDate>
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      <title>Milwaukee Introduces New-To-World Product For Testing Fluorescent Lighting</title>
      <description>Milwaukee Tool Corporation continues to expand their Test and Measurement line with the introduction of a new-to-world product for testing/troubleshooting fluorescent lighting</description>
      <link>http://www.testandmeasurement.com/article.mvc/Milwaukee-Introduces-New-To-World-Product-For-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Mon, 09 Jan 2012 11:31:00 GMT</pubDate>
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      <title>LeCroy Expands Leadership In Automotive Test Solutions To Address Emerging Technologies </title>
      <description>LeCroy Corporation, a worldwide leader in test and measurement instruments, recently released three new test packages to address the growing automotive segment</description>
      <link>http://www.testandmeasurement.com/article.mvc/LeCroy-Expands-Leadership-In-Automotive-Test-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Mon, 09 Jan 2012 09:38:00 GMT</pubDate>
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