Anritsu Company expands its broad mobile device test portfolio with the introduction of CTIA battery life test capability for its Signaling Tester MD8475B.
Recognizing the need for a ready-made test bench for its line of transceiver modules, Reflex Photonics introduces a complete line of Optical Tester for BER measurements on the LightABLE™ SR4 and SR12 rugged embedded transceivers and optical interconnects
Tektronix, Inc., a leading worldwide provider of measurement solutions, today released enhancements to its DisplayPort and Type-C transmitter test solution offering full support for the latest DisplayPort 1.4 specification
JTAG Technologies is excited to announce the immediate release of a new JTAG/boundary-scan test hardware interface product compatible with the MAC Panel mass interconnect system. The JT 2147/eDAK is a multi-function signal conditioning module that allows ‘ideal world’ connections from JTAG Technologies PXI and PXIe DataBlasters to the MAC panel ‘Scout’ connection system
NI, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced recently updates to the Wireless Test System (WTS), NI’s solution for multisite automated testing of wireless devices.
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