ADE Technologies Automated Head Wafer Mapper Test System

The DMS Division of ADE Technologies has received orders from multiple customers for its new Automated Head Wafer Mapper test system. The system is used by the disk drive industry for production testing of head wafers containing advanced head technologies, including magneto-resistive (MR) and giant magneto-resistive (GMR) heads. One system has already been installed.

Through the non-contact measurement of advanced head wafers, the product provides process feedback on the magnetic properties faster than previously possible. This early feedback can have a significant impact on wafer yield as well as on assisting users in advancing their new designs into production faster. In addition, it provides a detailed map of those magnetic properties over the surface of the wafer. The system provides high resolution at both high and low magnetic fields, allowing measurement of difficult parameters such as the exchange field. The system also has a MR option to directly measure the magneto-resistive effect.

ADE Technologies, Phone: 617-831-8004