Advantest Introduces T5588/M6300 Test Solution For High-Volume DDR2-SDRAM Devices

New Tester/Handler Combo Tests 512 Devices in Parallel, Dramatically Increases

TOKYO, June 7 /PRNewswire-FirstCall/ -- Advantest Corporation (TSE: 6857, NYSE: ATE), the world's largest supplier of semiconductor test equipment, today announced global availability of its newest memory tester, the T5588, and new dynamic test handler, the M6300. With twice the parallel test capacity of currently available models -- 512 devices per test cell -- the new test solution is ideal for high-volume production of high-speed, double-data- rate DRAM (DDR2-SDRAM) devices. The introduction of the T5588 reinforces Advantest's market leadership in delivering advanced technology solutions for its global customers' next-generation test requirements.

In recent years, the number of broadband customers has increased tremendously, as content providers utilize expanding bandwidths to introduce higher-quality audio, video, and other applications into their products. Consequently, in order to provide increased bandwidth, computer manufacturers are now transitioning from the current DDR-SDRAM memory modules to DDR2-SDRAM. Offering increased transmission speeds of up to 800 Mbps, these next- generation chips enable consumers to take full advantage of increased bandwidths and added device functionality. As a result, the price competition between IC manufacturers is predicted to escalate due to the expansion of the DDR2-SDRAM market, driving increased demand for volume-production solutions that deliver lower overall cost-of-test.

The T5588 memory test system offers a maximum test speed of 800 Mbps in its DDR mode. In its two-station configuration, it boasts a 512-device parallel package test capacity -- twice the capacity of its predecessor, the T5593 -- contributing to space-efficient test design. The tester further leverages Advantest's proprietary FutureSuite(R) operating system, which enables customers to choose between their existing ATL language or C, a worldwide standard language, to meet their test programming needs.

High-Performance Handler for Total Testing Solution The M6300, launched simultaneously with the T5588, is a high-performance material handler capable of parallel processing up to 256 memory devices with a range of packaging formats, including thin small-outline package (TSOP)-1, TSOP-2, chip scale package (CSP) and ball grid array (BGA). Combining increased functionality with the processing speed of the prior-generation M6542AD handler, the M6300 delivers a throughput of up to 12,000 units-per- hour (UPH). Its thermal-control function supports tests within a temperature range of -30 degrees C to +125 degrees C, with an option to extend the lower range to -55 degrees C. In addition, Advantest has developed a new air- pressure control system that adjusts contact pressure and speed to minimize contact failures, while enabling increased accuracy during pick-up and transportation of these extremely small, light devices.

This new construction has allowed Advantest to reduce the number of parts in each change kit-the component responsible for load management, which must be changed for each different device type-by approximately 70 percent. This contributes to significant savings for customers in both labor and the number of parts that must be purchased at changeover.

Advantest's new T5588+M6300 test cell will double today's parallelism capability and significantly lower the cost-per-site for performance volume testing of DDR2-SDRAM.

About Advantest
Advantest Corporation is the world's largest supplier of automatic test equipment to the semiconductor industry. Advantest's SoC, logic, memory, mixed-signal and RF testers and device handlers are integrated into the most advanced semiconductor fabrication lines in the world. Founded in Tokyo in 1954, Advantest established its North American subsidiary in 1982 and its European subsidiary in 1984. More information is available at http://www.advantest.com