Aehr Test Systems Dynamic Burn-In System

Aehr Test Systems is rolling out its new MAX3 Dynamic Burn-in System. The system provides semiconductor manufacturers with the ability to cost-effectively burn-in newly-emerging devices such as digital signal processors (DSPs), Rambus DRAMs and systems-on-a-chip as well as other integrated circuits and supporting devices that operate at today's lower voltages.

The MAX3 Dynamic Burn-in System features burn-in voltages as low as 0.7 v DC, providing a single burn-in solution for integrated circuits with line widths down to 0.18 microns and smaller. The system also features 96 input/output channels--double the number offered by most burn-in systems on the market today-- which allows a more complete exercise of higher pin-count devices and the manufacture of more reliable integrated circuits. The MAX3 utilizes Windows NT the powerful and operating system that is both easy to use and able to support a large network of MAX3 systems.

Additional features of the MAX3 include, memory patterns for both standard and embedded memory, vector patterns for logic, reconfigurable vector memory to 24 Mb deep for boundary scan applications, high-current capabilities for new highly-integrated devices, analog and digital signal generation (backwards compatible with MAX2, MAX-64000 and ATS-12000 burn-in boards), and three separate power supplies

Aehr Test Systems, Phone: 800-PRO-INFO (776-4636), (908-544-2850 outside the U.S.).