Boundary-Scan Best-In-Test Award To JTAG Technologies

Recognition for versatile Rack-Mountable Instrument

Stevensville, MD - JTAG Technologies has been selected by Test and Measurement World as the winner in the boundary-scan category of the prestigious Best-in-Test program for 2008. TMW's Best-in-Test judges select among innovative and beneficial products in several categories, placing JTAG Technologies' Rack-Mountable Instrument at the top of the highly-competitive boundary-scan category. The award was presented at the recent APEX show in Las Vegas.

The winning product, the JT 37x7 / RMI, closes the gap between structural and functional testing. With RMI, the newest member of JTAG Technologies' pace-setting DataBlaster line of controllers, it becomes a simple matter for electronics manufacturers to combine boundary-scan performance and test coverage with functional validation. The instrument is conveniently packaged in a standard 19-inch by 1U form factor for compatibility with virtually any rack-mounted functional test system. It supports all boundary-scan test applications including IEEE 1149.6 advanced digital network testing as well as in-system programming (ISP) of flash memories and programmable logic devices. With its four fully-compliant boundary-scan test access ports (TAPs), the RMI delivers excellent signal integrity at the target. In addition, the RMI provides 256 programmable I/Os to further enhance test coverage.

For convenience, TAPs and I/Os are available on the front panel of the unit, and the TAPs can be combined for test purposes or ganged for high-throughput testing and ISP. The TAPs can also be extended via flat cables from the front panel to satisfy special fixturing requirements. I/O channels are individually programmable as input, output, bi-directional or tri-state, and voltage thresholds can be programmed to 1.5, 1.8, 2.5, or 3.3V for use with modern low-voltage logic families. To reduce scan chain length and improve test efficiency, any number of 16-channel groups can be bypassed.

The RMI interfaces to the host computer via any of three standard formats, USB 2.0, Ethernet 10/100 and IEEE 1394 Firewire, giving it nearly universal applicability and ease-of-use. Test clock frequency is programmable up to 40 MHz allowing very rapid application execution, especially important for flash programming, while TAP voltages can be set for a wide range of input and output characteristics.

Peter van den Eijnden, President of JTAG Technologies, commented, "We wanted to be able to give our users a convenient way to combine their boundary-scan operations with functional testing. The RMI meets the need perfectly, and we're very gratified to receive this recognition from Test and Measurement World."

RMI is fully compatible with all JTAG Technologies' tools such as JTAG ProVisionTM. In combination with functional testing, the RMI works seamlessly with the industry's most popular architectures including National Instruments LabVIEW, LabWindows and TestStand as well as custom C/C++ and Visual Basic test systems.

SOURCE: JTAG Technologies