Dual-Well Test-Handler Solution For HP 3070

Hewlett-Packard and JOT Automation Inc. have introduced a dual-well test-handler solution, designed for the HP 3070 family of in-circuit test systems. The board handler enables fast throughput of printed circuit boards (PCBs) through the test cell.

The dual-well test handler operates by staging one board while another board is being tested. Conventional one-well test handlers take an average of more than five to six seconds.

Other features of the product include:

• the ability to minimize fixture change times for fast fixture changeover.
• a compact footprint, making the test handler the same size as the tester itself.
• automated test-cell manager software.
• complete support package available.

For more information, contact Hewlett-Packard Company, Test and Measurement Organization, 5301 Stevens Creek Blvd., MS 54LAK, Santa Clara, CA 95052. Telephone: 1-800-452-4844 ext. 5764.