Embedded ATE Solution

The icBIST3.0 from LogicVision is an embedded ATE solution for testing very submicron (VDSM) products. It is a test methodology that embeds the non-scalable portion of the external ATE inside the product. By embedding macro-function specific high data volume and high-performance portions of both the test and the tester into the product, icBIST3.0 solves the VDSM test and diagnostic problem in a scalable manner. The product provides a comprehensive suite of IP design objects and EDA tools that achieve at-speed testing and diagnostics for random logic, embedded memories, mixed signal cores and legacy cores at the chip level, and tests I/Os, interconnects and memory modules at the board level.

icBIST3.0 provides a suite of VDSM test and diagnostic capabilities including: at-speed, multi-frequency, multi-clock logic BIST with cross-domain timing, at-speed memory BIST for embedded SRAM/ROM/DRAM, 1149.1 TAP, boundary scan with enhanced flexibility, hierarchical isolation and access for test of legacy cores, mixed-signal BIST for PLLs and ADC cores, at-speed, external memory BIST for board-level SRAM/DRAM modules, at-speed interconnect test for board-level I/O and interconnects, and scan and test-point insertion.

LogicVision Inc., 101 Metro Dr., Third Floor, San Jose, CA 95110. Phone: 408-453-0146; Fax: 408-467-1180.