Eureka Memory Tester
With the new PC133 SDRAM3 Test Solution, Eureka tests SDRAM modules at 133Mhz, 100Mhz and 66Mhz. The optional leakage option perform DC parametric test on the module.
It is indeed, the most versatile and powerful memory module tester for the module manufacturers and distributors. Additional optional capability includes Flash testing, Cache testing, Chips testing, or just about any memory modules of any kind through special-custom built adapters.
Test Algorithms
The Eureka performs fast functional test ensuring module work in the final system environment. Multiple user Defined test patterns are used to detect shorts and opens. Comprehensive test cycles out soft failures including single cell failure, cross-cell-contamination, intermittent failure as well as timing and noise related errors.
DC-Parametric Test
Optional leakage adapter puts the tester under the DC-parametric mode to test for semiconductor leakage characteristics. It can detect minute leakage current that can lead to infant mortality on the DRAM chips.
SPD Programming
The tester is built-in with SPD (serial presence detect) programmer to program and verify SPD contents on the same pass as the module is being tested.
Enhancement Features
A few enhancement features are provided to streamline test accuracy. These are chip-heating, voltage bouncing, loop test, adjustable timing parameters (selected), alterable refresh mode and cycle, refresh test, ICC measurement, as well as Address and RAS/CAS test. It also supports buffered or unbuffered modules with parity and ECC bits.
Ease Of Use
This bench top SIMM/DIMM tester is designed for all situations. While for the high volume production setting, an ideal solution is to interface the Eureka with CST's new RoboFlex Automatic SIMM/DIMM/SODIMM Handler for hands-free testing. In all cases, the latest software enhancement and upgrade can be downloading from CST website at no additional charge.
CST Inc., 2336 Lu Field Road, Dallas, TX 75229. Tel: 972-241-2662; Fax: 972-241-2661.