Extended JTAG/Boundary Scan Functionality For SPEA 4040 Flying Prober

Jena, Germany - GOEPEL electronic, a worldwide leading vendor of JTAG/Boundary Scan solutions and SPEA introduced additional JTAG/Boundary Scan functions for the SPEA 4040 Flying Probe tester in the framework of their long-term OEM agreement. The new solution is based on the advanced Flying Prober ATPG (Automatic Test Program Generator) that is completely integrated in the JTAG/Boundary Scan development environment SYSTEM CASCON.

"Flying Probers combined with Boundary Scan play an important role in solving problems with reduced test access. The new software features make this platform more attractive", says Thomas Wenzel, Director of the Business Unit Boundary Scan at GÖPEL electronic. "The support of additional probes, paired with higher interactivity and safety, offers higher test throughput and test coverage than previous versions. This powerful combination creates a great solution from an economic standpoint for mix/low volume to medium production volumes."

"The inherent nature of SPEA's open software architecture enables the performance of this combination. It allows a third party software full access to all system resources", explains Detlef Dein, application engineer for SPEA. "The Flying Probe now covers all test ranges – analog as well as digital."

For the first time, using the extended ATPG tool (Automatic Test Program Generation), the Flying Prober's bottom probes are now included in the Virtual ScanPin methodology for automatic test pattern generation for the first time. The probes work as virtual bi-directional Boundary Scan pins in the frame of interconnection tests, and enable extended fault coverage, and in particular, for open faults in BGA components. Utilising the integration of the two systems, the Boundary Scan software takes over the probe positioning, using the definition from the SPEA Board Export with test points on the upper and lower side of the UUT. In addition to automatically generated tests, all probes can also be used for manual test program generation at same levels as the natural Boundary Scan cell. The innovation is in the analog measurement function, e.g. the measurement of on-board voltage or measuring and evaluating unknown signal levels within a Boundary Scan test program. Another innovative feature is re-test, wherein a potentially faulty or intermittent test step can be re-contacted and the user can program the number of repeats. This results in a higher quality of test as false failures are eliminated.

The enhanced IEEE Std. 1149.1 tools are integrated in SYSTEM CASCON from V 4.4.1b onwards, and are activated per license manager. The features are available at no cost for OEM customers with a valid maintenance contract.

SOURCE: GOEPEL electronic