Flicker Noise System Integrates DSA

NoiseProPlus 9812D, ProPlus Design Solutions’ wafer-level 1/f (flicker) noise-measurement system, delivers accurate measurement up to 10 MHz, while its built-in DSA (dynamic signal analyzer) eliminates the need for external signal-processing equipment.

The system measures low-frequency noise characteristics of on-wafer and packaged semiconductor devices, including MOSFETs, BJTs, JFETs, diodes, and diffusion resistors.

Built on the same foundation as its predecessor the 9812B, the DSA-equipped 9812D boasts a 3X to 10X throughput improvement for faster data collection and early detection of process issues. It also handles up to 100 V from the source-measure unit for high-voltage and/or low-current (<0.1 µA) biases. Additionally, the 9812D employs multiple voltage and current low-noise amplifiers to ensure high measurement accuracy.

NoiseProPlus software drives the system and provides enhanced usability and easier setup for full current-voltage characteristics, 1/f and RTS (Random Telegraph Signal) noise measurements, and graphical analysis of measured data. It can control a semiautomatic probe station for multiple-die, multiple-device, and multiple-type statistical noise measurements and has been optimized for processing and analyzing massive noise data