Formfactor Ships New 26,000 Pin-Count Wafer Probe Card

Livermore, CA - FormFactor, Inc. recently announced a major milestone with the shipment of its first 26,000 pin-count wafer probe card, which is based on its new PH150XP platform. Representing the highest pin-count product manufactured and shipped by FormFactor to date, the wafer probe card will be used by Tera Probe Inc., a packaging and wafer test service provider, for production testing of its customers' advanced DRAM wafers.

With the density and complexity of advanced ICs continuing to rise, improving test productivity has become increasingly critical to controlling test costs. FormFactor's proprietary wafer probe card architecture and technologies enable the production of highly robust and ultra-high pin-count probe cards that allow IC manufacturers to test more devices simultaneously, or in parallel, on a wafer. This capability enables FormFactor's customers to increase their test throughput with their existing capital equipment.

"With FormFactor products and solutions, IC manufacturers can test more die in parallel without compromising on performance. The result for our customers is the ability to significantly reduce their overall cost of test," explained Igor Khandros, FormFactor's chief executive officer. "We're seeing a clear trend in the industry to increase the number of pins per chip in wafer test due to the increasing performance of and need for better power delivery to advanced devices. We're pleased that Tera Probe will be using our high pin-count probe card to help meet its customers' advanced DRAM production goals."

SOURCE: FormFactor, Inc