GOEPEL Introduces IEEE-Std. 1149.6 Compliant JTAG/Boundary Scan I/O Module

Jena, Germany and Las Vegas, NV – At the APEX tradeshow, GÖPEL electronic, a worldwide leading vendor of JTAG/Boundary Scan solutions compliant to IEEE1149.x, introduces a brand-new I/O module called CION Module/FXT114S.

This new low-cost module is controlled via a standard Test Access Port (TAP) and provides a total of 114 parallel I/O channels with IEEE-Std. 1149.1 compliant test resources, where 50 of those channels also support IEEE-Std. 1149.6 for the structural test of high-speed differential interfaces. Due to the small dimensions of the CION/FXT114S, the module can easily be integrated into test adapters.

"With this new I/O module we are addressing the growing demand for structural test support of Advanced Digital Network featuring IEEE 1149.6 capabilities", says Raj Puri, Vice President Marketing and Sales at GOEPEL electronics. "The combination of IEEE 1149.1 and IEEE 1149.6 I/O capabilities on a single module for integration into test adapters offers our customers a low-cost alternative to extend their structural test capabilities for high-speed interfaces in production environments".

The CION Module/FXT114S provides 64 single-ended test channels, controlled by GOEPEL electronic's CION ASIC devices. All channels are independently controllable as Input/Output/Tristate and the I/O voltage can be programmed from 1.8V to 5.0V in groups of 32 channels. Additional pin driver features support a high current capability, while special safety measures, such as the CION's ‘UNSTRESS' feature, protect the Unit Under Test (UUT) against damage in case of shorts. In addition to the single-ended I/O channels, the CION Module™/FXT114S provides 50 differential (LVDS) channels with IEEE 1149.1 and IEEE 1149.6 compliant test resources. Of those differential channels, 25 are configured as inputs and the other 25 are configured as outputs.

If additional test channels are required in addition to those available on the CION Module/FXT114S, multiple CION modules of the same or different types are easily daisy-chained through their TAP interfaces.

These capabilities make the CION Module/FXT114S highly suitable for the test of non-scannable circuit clusters, peripheral connectors, backplanes, and AC-coupled networks in applications for example in the telecommunication, industrial and embedded control, aerospace, and automotive industries.

This new CION module is fully supported in the integrated JTAG/Boundary Scan software platform SYSTEM CASCON and can be used with any ScanBooster and SCANFLEX Boundary Scan controller. SYSTEM CASCON is the most innovative development environment for IEEE-Std. 1149.x applications for well over a decade and includes more than 38 fully integrated tools. The user can easily include the CION Module/FXT114S in a test project, generate the desired test vectors fully automated with ATPG tools supporting both IEEE1149.1 and IEEE1149.6, and obtain detailed diagnostic results in case of faults detected during test execution. Detected faults are visualized at pin and net-level (e.g. in the UUT's layout file) and the UUT is debugged interactively.

SOURCE: GOEPEL electronic GmbH