HP Measurement Organization to Hold Semi-Test User Conference

Hewlett-Packard Company's Measurement Organization announced it will hold its second annual semiconductor user group conference in San Diego, April 5 through 7. This year's conference will feature six technical tracks covering the following topics:

• Effective use of the HP 83000 high-speed digital IC test system for applications including multimedia system-on-a-chip, embedded memory, and RAMBUS interface testing;
• Mixed-signal and communications IC test applications on the HP 94000 and 9490 series mixed-signal test systems;
• RFIC and wireless IC test applications on the HP 84000 and RF 9490;
• Semiconductor parametric test applications and IC fab process monitoring using HP 4062 and 4071 parametric test systems;
• Optimizing design, test and production efficiencies.

The user group conference theme, "Expanding Your Possibilities,'' underscores how HP's test solutions, systems and services can best provide users with innovative ways to maximize their test-system investment. More than 60 technical papers will be presented at the conference.

Retired Space Shuttle Astronaut Colonel Michael Millane will open the conference with a keynote speech on lessons learned from pre-disaster test data on the ill-fated Challenger. As part of the conference, HP also will host a hospitality dinner event at the Scripps Institute of Oceanography's Birch Aquarium.

HP is holding the conference at the Loews Coronado Bay Resort. All HP test-system users are welcome to attend. Industry analysts and consultants also can request an invitation. Conference information and registration can be found at http://www.learn.niu.edu/conf/hp or by calling 1-888-648-2033. Discounted registration is available through March 26.