Keithley Sponsors Six Web Seminars Focused On Nanotechnology

Cleveland -- Keithley recently hosted its Nano Days Web Seminars, comprising of six web-based seminars on nanotechnology presented by various industry leaders. Each seminar is now archived on Keithley's web site. Details of each seminar are provided below.

Seminar #1
TITLE: Advanced particle beam methods for nano-characterization and analysis
SPEAKER: Dr. Jens Greiser, FEI Company, Eindhoven, The Netherlands

ABSTRACT
Every historic era has had its material building blocks from which visionaries and pioneers pursued new ideas and concepts by understanding the relationship between the properties and required functions of materials. Today, nanotechnology is ultimately linking properties and functions by understanding, manipulating, and shaping microstructures down to the atomic level. Nanotechnology is changing material design rules from empirical-based approaches into knowledge-based problem-solving. Click her for more details and to register.

Seminar #2
TITLE: In-situ Correlation of Mechanical Properties, Deformation Behavior, and Electrical Characteristics of Materials Using Conductive Nanoindentation
SPEAKER: Ryan C. Major, PhD, Senior Staff Scientist, Hysitron, Inc., Minneapolis, Minnesota, USA

ABSTRACT

Nanomechanical testing techniques have become a popular method for quantitative, small volume mechanical property determination. Conceptually, nanoindentation is a relatively straightforward technique where an indenter probe of a well-known geometry is pushed into and withdrawn from the material's surface while the force and displacement are continuously recorded to a high degree of accuracy and sensitivity. A new nanomechanical characterization technique, generally referred to as conductive nanoindentation, combines nanoindenter hardware with a conductive probe and a voltage/current SourceMeter® instrument to get a time- based correlation of force, displacement, voltage, and current. Click here for more details and to register.

Seminar #3
TITLE: How to Avoid Self-Heating Effects on Nanoscale Devices
SPEAKER: John Tucker, Lead Marketing Engineer: Nanotechnology, Research, & Education, Keithley Instruments, Cleveland, OH USA

ABSTRACT
Nanoelectronics is a rapidly developing field with potential impact across a wide range of industries. Devices such as carbon nanotubes, semiconductor nanowires, graphene-based electronics, molecular organic-based electronics, and single electron devices are routinely researched and characterized today. Characterizing the electrical properties of these delicate nanoelectronic components and materials requires instrumentation and measurement techniques optimized for low power measurements. Click here for more details and to register.

Seminar #4
TITLE: Give Your Microscope a Hand: Characterization of Nano Structures
SPEAKERS: G. Frayne, S. Kleindiek, B. Volbert, Kleindiek Nanotechnik, Reutlingen, Germany

ABSTRACT
Nowadays, Scanning Electron Microscopes (SEM) and Focused Ion Beam Systems (FIB) are optimized for their imaging and analytical capabilities. In-situ manipulation allows the preparation and characterization of specific nano-structures, such as electronic structures, nanowires, and nanotubes.

The presentation will introduce the basic manipulation technology, consisting of a single or multiple micro-manipulators, which can be equipped with different plug-in tools, such as a tip, gripper, four-point probe, LCMK (low current measurement kit), micro-injection, force measurement system, etc. Click here for more details and to register.

Seminar #5
TITLE: Electronic Properties of Zinc-Blende Wurtzite Biphasic Gallium Nitride Nanowires and NanoFETs
SPEAKERS: Mr. Benjamin W. Jacobs & Dr. Virginia M. Ayres, Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI USA

ABSTRACT
Direct two-point and four-point probe measurements of a biphasic gallium nitride nanowire were conducted using a Zyvex Nanomanipulator coupled with a Keithley 4200 Semiconductor Characterization System. The nanomanipulator probes in this four-point probe configuration provided non-invasive coupling to the nanowire for accurate nanowire resistance measurements. Nanowire breakdown investigations in the two-point probe configuration were also conducted, and indicated single-phase electron transport. Click here for more details and to register.

Seminar #6
TITLE: Measurement Needs in Nano-Architectonics
SPEAKER: Dr. Kang L. Wang, FCRP Center on Functional Engineered Nano Architectonics (FENA) & NRI - Western Institute of Nanoelectronics (WIN), Los Angeles, CA USA

ABSTRACT
The art of orchestrating a new paradigm beyond conventional scalable CMOS for functional throughput is the ultimate challenge facing nanoelectronics. New solutions that take advantage of clever functional materials, self assembly processes, low dissipation nanoscale devices and architectures are just some elements that need to be considered to meet the grand challenge—maintaining Moore's Law beyond the roadmap. Most advances in nanoelectronics have been based on the conventional state variable, electron-charge. Electron-charge can be considered as a variable that is able to alter between various states of population (charging/discharging of capacitance). Click here for more details and to register.

SOURCE: Keithley Instruments, Inc.