Luna Technologies Introduces 1310 nm Optical Backscatter Reflectometer
The new wavelength functionality of the OBR will help component and system level designers eliminate the time and expense of component characterization and short-haul optical link integrity management for a range of new applications that cover the 1310 nm wavelength band, including passive optical networks for FTTx and active networks for avionics applications. The new wavelength capability will also allow users to troubleshoot fiber-optic modules for DWDM applications by "seeing through" optical elements such as isolators and erbium doped fiber that are opaque in the 1550 nm wavelength region. Further enhancements enable Luna to extend the measurement range of the OBR to over 300 meters with sub-millimeter resolution.
"The new 1310 nm OBR from Luna Technologies fills a very important measurement need for us," said Scott Williams, Laboratory Manager of the University of North Carolina at Charlotte's Center for Optoelectronics and Optical Communications. "It has all of the functionality in terms of sensitivity, range, and resolution as the 1550 nm system, but it allows us to measure critical components in the wavelength band they were designed to operate."
"The OBR represents a shift in the way manufacturers produce and manage fiber-optic equipment," says John Goehrke, Chief Executive Officer of Luna Technologies. "This addition to the OBR product line allows our customers to significantly reduce both their time and cost of test for a much broader range of modern optical networking components."
The OBR comes configured with an integrated internal tunable laser source, a computer and a monitor. It is available immediately with a six to eight week delivery time.
SOURCE: Luna Technologies: