Options for J973 VLSI Test System Used for High-Performance Device Testing

Teradyne Inc.troduces its newest suite of options for the J973 High-performance VLSI Test System. The three new options, VHF Digitizer Option (VDO), 100A Voltage Source Option, and the Time Digitizer Option (TDO) are now available for factory or field installation. The high performance digital, advanced memory and broad scan capabilities options enable the J973 to provide solutions for high performance device test challenges.

VHF Digitizer Option (VDO)
The J973 VHF Digitizer Option (VDO) provides the capabilities for full characterization and single pass production testing of integrated graphics and core logic devices. VDO is based on Teradyne's Catalyst series VHF Digitizer instruments and delivers precise, flexible analog sampling to ensure the highest accuracy and throughput for characterization and production test.

100A Voltage Source Option (GVS)
The precision high current DUT power supply (100A Ganged Voltage Source) provides fast response to large changes in current demand while maintaining accurate supply voltage.

Time Digitizer Option (TDO)
High performance device designs are now based on the use of PLLs or DLLs (Delay Locked Loops) in order to achieve high core speed and manage device timing skews. The J973 Time Digitizer Option (J973 TDO) provides 10ps typical RMS jitter measurement accuracy for analyzing both short and long term jitter effects.

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