Brochure: PM300 Manual Probe System

The SUSS PM300 Probe System is the ideal solution for engineering tests of 300 mm wafers and substrates. Whatever your application, the versatility of the PM300 meets all requirements from failure analysis (FA) to device and wafer characterization (DWC) to wafer level reliability (WLR) testing and always ensures the highest possible degree of precision and accuracy available on the market. Testing flat panel displays becomes as easy as child's play when the PM300 is equipped with the optional square chuck.