Semiconductor Test Equipment

A single platform with test capabilities that include, advanced mixed signal, high-speed digital, digital signal processing, RF wireless, memory, power, and time measurement allows the user to cover the entire test spectrum from pure analog to pure digital.

Fusion uses a single hardware platform and a broad range of available test configurations to ensure that your test capability stays current.

Fusion tests complex ICs, including systems-on-a-chip. Some options available include: ActionBus, to synchronize events between all instruments for precision control of each test. enVision++, for program development of mixed signal devices. FastPath, which has a short electrical distance between the test head and device under test pins. FlexWave, is the company's new high-performance 250/500MHz digital timing subsystem featuring independent per-pin event-based waveform generation. HSDC, which has a high-speed data channel capability for testing the high-speed serial interfaces used in new communication protocols such as FibreChannel, FireWire, and PanelLink. HiPer II, is the next generation of LTX's pin electronics technology. It provides higher-bandwidth source and measure and new 50mV minimum swings. HiPerPhase is a differential I/O that is a mode of the HiPer II pin that can drive differential waveforms and perform a true differential comparison on DUT output signals for testing today's high-speed communications devices. IDDQuik is used for high-speed IDDQ testing. PerPinAPG gives you per-pin APG capability to test multiple embedded memories in parallel. PowerPulse allows IC manufacturers to deliver up to 160 A to the DUT at a full power bandwidth in excess of 1 MHz. System Configuration Module (SCM) is a two-level socket adapter that offers a solution to the differing requirements of digital and mixed signal DUT boards.

LTX Park at University Avenue, Westwood, MA 02090-2306. Phone: 781- 461-1000; Fax: 781-326-6659.