SynTest Enters BIST Market with Memory Testing

SynTest Technologies, an EDA company and supplier of DFT tools for IC designers and foundries, today announced its first entry into the BIST market with TurboBIST-SRAM. The product is used for design, test development, and testing of embedded single and dual-port RAMs. It also synthesizes SRAM BIST structures for any user-specified test algorithms.

SynTest offers TurboBIST-SRAM as a tool and as a service for customers who send SynTest their functional circuits descriptions in either VHDL or Verilog HDL. SynTest returns fully implemented BIST and test bench/test pattern information for inclusion in their system-on-chip designs.

TurboBIST-SRAM synthesizes built-in self-test (BIST) structures around embedded SRAM cells used in SoC designs. It adds the necessary BIST controller logic and automatically generates the BIST test patterns needed to run in an embedded memory cell production environment.

SynTest Technologies, Inc. 505 S. Pastoria Ave, Suite 101, Sunnyvale, CA 94086, USA, 408-720-9956, Fax: 408-720-9960, info@SynTest.com,