Teradyne's J750 Accepted by Several Chip Manufacturers

Teradyne's INTEGRA Test Division (ITD) announced today that multiple INTEGRA J750 VLSI test systems have been accepted into production by several chip manufacturers. The INTEGRA J750, introduced in April of this year, is an integrated series of test systems designed for testing devices in the low-end and mid-range VLSI chip markets such as, FPGAs, PLDs, microcontrollers and digital audio/video devices. After performing rigorous system acceptance procedures, the INTEGRA J750 will go into production at the following customer facilities: Microchip Technology, ESS Technology, and Silicon Storage Technology (SST).

The INTEGRA J750 delivers up to 1,024 digital channels into a zero footprint system entirely contained within a test head. Its parallel testing throughput capabilities help deliver 95% parallel test efficiency for up to 32 devices. The system also features IG-XL test software.