Test Clips

Micro SMD Grabber Test Clips, designed for testing fine-pitch IC packages are suited for use in R&D labs for prototype design and debugging applications. Three grabber styles are offered including both short and long tip styles for 0.8 mm to 0.5 mm lead pitches and one for lead pitches as small as 0.3 mm. These grabbers can be used with any fine-pitch IC including QFP, PQFP, SSOP, and TSOP and TSSOP packages. The thin body design allows for side-by-side stacking for adjacent probing. The pincer tips are Teflon-insulated to guard against shorting. All styles can be used at frequencies up to 100 MHz and are supplies with flying leads for logic analyzer attachment.

Pomona Electronics, 1500 E. Ninth St., Pomona, CA 91766. Phone: 909-623-3463; Fax: 909-629-3317.