Texas Instruments Orders Aehr's MAX Burn-In Systems

Aehr Test Systems announced that Texas Instruments has ordered enhanced versions of its MAX Dynamic Burn-in System. These systems will be used by Texas Instruments primarily in their Digital Signal Processing Group to meet their dynamic burn-in requirements world-wide.

The enhanced MAX system is designed for DSP and microprocessor applications incorporating System LSI. Some of the major features of the system include:

• Low-voltage semiconductor testing for new generation low-voltage chips
• High-current capabilities for new highly-integrated devices
• Analog and digital signal generation
• 96 I/O channels for burning-in higher pin-count devices
• Vector patterns for logic testing
• Reconfigurable vector memory for boundary scan applications
• Memory patterns for embedded memory

Delivery of the enhanced MAX systems to Texas Instruments is expected to begin later this year.