Wafer-Sort Test System
Hewlett-Packard announced the HP V1300 Flash-memory test system that independently tests up to 16 high-density, NVM Flash devices with as many as 64 signal pins, or 32 lower-density NOR and NAND Flash devices
Hewlett-Packard announced the HP V1300 Flash-memory test system that independently tests up to 16 high-density, NVM Flash devices with as many as 64 signal pins, or 32 lower-density NOR and NAND Flash devices.
The HP V1300 is a memory-test system with per-pin timing resources for 16 DUTs, APG-controlled parametric testing, redundancy analysis, and bit-mapping capabilities. It features twice the throughput of HP's current Versatest system, but it does not require any additional floor space.
Hewlett-Packard, Corporate Communications, 3000 Hanover St., Palo Alto, CA 94304. Phone: 800-452-4844.
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