Teradyne Introduces 10-Bit Waveform Generator Lan And Prml Device Testing Solution

Teradyne (Boston, MA) introduced the the AWG2400 arbitrary waveform generator offered on Catalyst and A5 family test systems. It is designed specifically for multi-site greater than 1.2 Gb PRML disk drive and 1000BaseT LAN testing. The AWG2400 features 2.4 GS/s sample rate, 10 bits of resolution, and 1.4 GHz of bandwidth.

Dave McAninch, Mass Storage Product Manager for Teradyne, said, "Generating today's demanding high-speed signals requires three key elements: bandwidth, resolution, and sample rate. All three elements are necessary for uncompromised testing of 1000BaseT LAN devices and greater than 1.2 Gbit PRML read channels. Other high-speed analog waveform generators deliver a maximum resolution of eight bits with less than 1 GHz of bandwidth."

When combined with Catalyst's multi-site test environment, the AWG2400's dual differential outputs facilitate parallel test of multiple LAN or mass storage devices to reduce the cost-of-test without extraneous hardware on the device interface board. The Teradyne AWG2400 also features a wide selection of filters that range in bandwidth from 30 MHz to 1 GHz. The filters are optimized for either frequency domain performance (sharp cutoff) or time domain performance (good step response) resulting in a flexible design that makes creating tests easy for both datacom and mass storage test engineers.

Catalyst is a system-on-a-chip test system used for SOC testing for emerging communications appliances in networking, wireless, and home applications. Catalyst's parallel CPU design enables high efficiency, simultaneous testing of multiple ICs for the lowest cost-to-test. The Catalyst SOC test platform coupled with IMAGE, VX Test Simulation Software -- a suite of design-to-test simulation tools -- and the new AWG2400, provide users with the most state-of-the-art and powerful testing solutions available today.

Teradyne, Inc. Phone: 617-422-2567; Fax: 617-422-2530