Supplier News

  1. Tektronix Launches Software For Digital RF Test Signal Creation And Editing 7/27/2007
    Tektronix, Inc. announced the availability of RFXpress, an advanced new software package that performs RF/IF/IQ waveform creation and editing of digitally modulated signals for AWG5000 and AWG7000 arbitrary waveform generators
  2. Handheld, Portable Imaging System Capable Of Seeing Into And Through Solid Objects Developed 7/23/2007
    Walleye Technologies and the Harmonix Division of Terabeam Corporation have formed an alliance to develop a next-generation, handheld, portable imaging technology capable of "seeing" into and through solid objects
  3. Keithley Introduces Linux-Based RF Parametric Test Systems 7/23/2007
    Keithley Instruments, Inc. announces a group of enhancements for its S600 Series Parametric Test Systems. The main enhancement is a migration to the Linux Operating System (OS) on the embedded control computer within each test system
  4. Luna's Test And Measurement Instrument Receives “R&D 100” Award For Technical Innovation 7/17/2007
    Luna Technologies’ Optical Backscatter Reflectometer (OBR) with distributed sensing has received a 2007 R&D 100 Award from the editors of R&D Magazine as one of the 100 most technologically significant new products introduced into the marketplace in the last year
  5. Software Shapes Next-Generation RF Instrumentation 7/3/2007
    The growth of RF technology in the wireless communication industry over the past few years has been astonishing. This year alone, more than 850 million cellular phones will be manufactured and sold around the globe. As production volumes rise, test engineers are being challenged to increase their test throughput and decrease their cost of test. The rapid development of new standards also requires new sourcing and measurement capabilities
  6. Selecting Telecommunication Test Equipment To Maximize Throughput And Accuracy 7/3/2007
    By Robert Green, Keithley Instruments, Inc.
    Soaring demand for cell phones, pagers, mobile radios, and basestations, is putting pressure on test engineers to shorten production test time. This may require selection of new test equipment that can improve throughput and accuracy in several areas, including a wide variety of DC and low-frequency board-level tests and battery testing or simulation.
  7. SDR Advantages For Test Equipment 7/3/2007
    By Michael D. Millhaem, Keithley Instruments
    Test equipment manufacturers have begun to implement instrument designs using software-defined radio (SDR) principles and devices. This article provides a brief overview of software-defined radio techniques, how SDR is implemented in test equipment and the advantages that test equipment manufacturers and customers realize from these designs...
  8. LXI Clears The Way To Smarter Instruments 7/3/2007
    The trend toward more intelligent instruments has become increasingly evident as vendors of test and measurement equipment take advantage of increased processing power to expand the features and functions their products provide. These include advanced data analysis and reduction, more sophisticated sequencing and control, and built-in functions targeted at specific T&M applications. This paper details how the capabilities included in the LXI (LAN eXtensions for Instrumentation) Standard enhance and accelerate the trend toward smarter instruments. It examines how the new generation of LXI smart instruments will lower the total cost of test while improving performance, increasing flexibility, and enhancing ease of use
  9. Software-Defined Radio: The Next Wave In RF Test Instrumentation? 7/3/2007
    By Michael Millhaem, Keithley Instruments, Inc.
    The communications market is challenging due to the rapid development of new standards, which often require new stimulus and measurement capabilities. To keep pace, test vendors must find new approaches that reduce instrument development times and allow instruments to adapt to new requirements. Software-defined radio is one technique that can help...
  10. Understanding The Perils Of Spectrum Analyzer Power Averaging 7/3/2007
    The following article explores the issues associated with power averaging in order to help readers avoid making the same mistaken assumptions the author did. The conclusions presented here are the results of an experiment that involved correlating the power measurements of two spectrum analyzers from different vendors. However, the issues discussed are generic in the sense that they apply to any spectrum analyzer power measurement with some form of post-detection averaging