Supplier News
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Statistical Process Control Of Wireless Device Manufacturing Requires Production Worthy S-Parameter Measurements
7/3/2007
By Carl Scharrer, Keithley Instruments
Whether you are manufacturing RFICs for cell phone modules on III-V wafers or DSPs on a silicon-based technology, predicting final product performance and reliability requires S-parameter measurements at the wafer level to complement the DC data. This is only practical when calibration and deembedding of the S-parameters is automated, along with probe cleaning. The ideal case, as described in this article from Keithley Instruments, is to have a single test operation collect the DC and S-parameter data... -
Keithley Launches 6½-Digit USB Digital Multimeter For Test Applications
7/2/2007
Keithley Instruments, Inc. announces the release of the Model 2100 6½-Digit USB Digital Multimeter (DMM), a high precision, low-cost USB-based instrument
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ESD Safety In Manufacturing And Data Tracking
6/21/2007
Electrostatic discharge, more commonly known as ESD, appears in many forms. From lightning bolts to a near-invisible spark when touching a piece of metal, there is no single way to encapsulate all of the different forms of ESD. In many cases, ESD can be felt in the form of a mild shock, usually more irritating than painful. However, when it comes to the world of electronics and manufacturing, this little shock can prove costly. One of the primary challenges facing any manufacturer is tracking inventory and supplies without compromising ESD safety. Submitted by Microscan
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Mini Imager: Powerful New Mini Imager Reads Tiny Codes Barely Visible To Human Eye
6/11/2007
Microscan Systems announced a new development in mini imagers. With 3 megapixel imaging, the Quadrus MINI 3 extends bar code imaging technology, and, according to the company, provides the highest resolution available today for data tracking
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MTT-S 2007: Keithley Enhances RF Vector Signal Generator To Accommodate More Waveforms
6/8/2007
Keithley Instruments, Inc. announced a series of enhancements to its Model 2910 RF Vector Signal Generator. The new capabilities included in the Model 2910 V2.0 include additional wireless signal generation waveforms, a new power calibration feature, and increased ARB memory to accommodate more and larger waveforms
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Making Power Measurements In The Field
6/7/2007
By Stefan Pongratz, Anritsu Company
Increasing data demands are changing the modulation signals in today’s communication systems. Digitally complex signals such as CDMA, EV-DO, GPRS, EDGE, W-CDMA, and WiMAX add complexity to power measurement testing. These signals can have a large crest factor, and a 10 to 12 dB peak-to-average power ratio is common for quadrature amplitude modulated signals. This amplitude variation puts a constraint on the power meter solutions that can be used to obtain accurate power measurements, especially in the field... -
Electropolish Products At No Cost
6/6/2007
If you've ever considered electropolishing for your stainless steel products or parts — or you're currently using another electropolishing service — Allegheny Surface Technology (AST) has an irresistible offer for you
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SUSS MicroTec AG Appoints New Chief Financial Officer
5/16/2007
SUSS MicroTec has appointed Michael Knopp as the Group’s new Chief Financial Officer. He will join SUSS on August 1st 2007 and succeeds Stephan Schulak who left the company at the end of March
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Keithley Sponsors Six Web Seminars Focused On Nanotechnology
5/11/2007
Keithley recently hosted its Nano Days Web Seminars, comprising of six web-based seminars on nanotechnology presented by various industry leaders
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Tektronix Enhances RF Scout To Enable Benchmarking Of Carrier Network Coverage
5/2/2007
Tektronix, Inc. announced the enhancement of its RF Scout Interference Hunter tool's applications to include a radio frequency benchmarking capability, enabling competitive measurements of carrier network quality and coverage
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