NI Helps Accelerate Test Program Development and Improve Operational Efficiency With NI Semiconductor Test System (STS) Software Enhancements
NI, the provider of a software-defined platform that helps accelerate the development and performance of automated test and automated measurement systems, announced recently new STS software enhancements that deliver significant improvements to the programming and debugging experience, test execution speed, parallel test efficiency and overall equipment efficiency for the NI Semiconductor Test System
Keysight Technologies Announces The First Single Box, Multi-Channel Solution For Wideband mmWave Measurements
Keysight Technologies, Inc., a leading technology company that helps enterprises, service providers and governments accelerate innovation to connect and secure the world, announced the first single box multi-channel solution for wideband mmWave measurements.
Keysight Technologies Launches New Radio Frequency Vector Signal Generator
Keysight Technologies, Inc., a leading technology company that helps enterprises, service providers and governments accelerate innovation to connect and secure the world, announced the new CXG X-Series Radio Frequency (RF) Vector Signal Generator (CXG), which delivers advanced performance, is standards-compliant, and meets the demands of engineers designing IoT and general-purpose devices at a reasonable price.
New VoIP Phone Capabilities In Fluke Networks’ MetroScope Carrier Ethernet Analyzer Offer Efficient And Accurate VoIP Field Testing
Fluke Networks announced today the addition of VoIP phone functionalities to the MetroScope carrier Ethernet analyzer
Fulcrum And Ixia To Demonstrate Fibre Channel Over Ethernet At Supercomputing 2008
Fulcrum Microsystems and Ixia, a leading, global provider of IP performance test systems will participate in a multi-vendor Fibre Channel over Ethernet (FCoE) interoperability test to demonstrate a true unified 10 Gigabit Ethernet (10GbE) data center fabric serving both storage area networking (SAN) and local area network (LAN) data flows
SUSS MicroTec Introduces The iVista LC
SUSS MicroTec Test Systems, the premier supplier of wafer-level test solutions for semiconductor devices, today announced the iVista LC High-Resolution Digital Microscope
Convergent Industrial Applications Profit From Widespread Adoption Of Analog Devices Processors
The industry’s broadest portfolio of embedded and signal processing choices is what increasingly attracts industrial application developers to technologies from Analog Devices, Inc.
Giga-tronics Incorporated Awarded $1M From Equipment Management Technology, Its Leasing And Rental Partner For High-End RF And Microwave And Test Equipment
Equipment Management Technology (EMT), a leader in electronic test equipment asset management has placed a $1M purchase order with Giga-tronics (NASDAQ:GIGA) for RF and microwave test solutions including Fast-Switching Microwave Signal Generators, High-Accuracy Power Meters and the newly introduced 2 to 20 GHz High Power Amplifier
Tokyo Electron (TEL) Introduces A Dual Purpose 300mm Dicing Frame Prober
Tokyo Electron, Ltd. (TEL) today unveiled the company’s new 300mm Dicing Frame Prober, the WDF 12DP. Designed to address the increasing demand for probing of ultra thin and diced wafers, the system can also be used as a standard wafer prober
Agilent Technologies Introduces Industry’s First Device Analyzer With Curve Tracer Functionality For Power-Device Evaluation
Agilent Technologies Inc. today introduced the industry’s first power device analyzer/curve tracer able to characterize semiconductor devices at up to 3,000 volts and 20 amps in a single box solution