Business Wire

1. LitePoint And Pegatron 5G Successfully Launch Volume Manufacturing Of 5G O-RAN Radio Units To Power Private 5G Networks 5/20/2025

   LitePoint, a leading provider of wireless test solutions, and Pegatron 5G, a leading provider of end-to-end 5G product solutions, have jointly announced a milestone in their collaboration; the start of high-volume manufacturing for 5G O-RAN radio units.

2. Keysight Introduces Next-Generation Embedded Security Testbench 4/9/2025

   Keysight Technologies, Inc. announces the launch of the Next-Generation Embedded Security Testbench, a consolidated and scalable test solution designed to address the increasing complex security testing demands of modern chips and embedded devices.

3. Keysight Introduces Optimized In-line High Density In-Circuit Test System For Printed Circuit Board Assemblies 11/13/2023

   Keysight Technologies, Inc.introduces the new Keysight i3070 Series 7i in-line test system, an automated in-circuit test system (ICT), offering increased capacity and throughput, that enables manufacturers to economically meet the complex test demands of larger node count printed circuit board assembly (PCBAs).

4. Fortive To Acquire EA Elektro-Automatik, An Industry-Leading Provider Of Electronic Test & Measurement Solutions 10/23/2023

   Fortive Corporation (“Fortive”) announced today that it has entered into a definitive agreement to acquire EA Elektro-Automatik Holding GmbH (EA), a leading supplier of high-power electronic test solutions for energy storage, mobility, hydrogen, and renewable energy applications, for $1.45B in cash, net of $215M of tax benefits from Bregal Unternehmerkapital.

5. New VoIP Phone Capabilities In Fluke Networks' MetroScope Carrier Ethernet Analyzer Offer Efficient And Accurate VoIP Field Testing 11/17/2008
   Fluke Networks announced today the addition of VoIP phone functionalities to the MetroScope carrier Ethernet analyzer
6. Fulcrum And Ixia To Demonstrate Fibre Channel Over Ethernet At Supercomputing 2008 11/12/2008
   Fulcrum Microsystems and Ixia, a leading, global provider of IP performance test systems will participate in a multi-vendor Fibre Channel over Ethernet (FCoE) interoperability test to demonstrate a true unified 10 Gigabit Ethernet (10GbE) data center fabric serving both storage area networking (SAN) and local area network (LAN) data flows
7. SUSS MicroTec Introduces The iVista LC 11/11/2008
   SUSS MicroTec Test Systems, the premier supplier of wafer-level test solutions for semiconductor devices, today announced the iVista LC High-Resolution Digital Microscope
8. Convergent Industrial Applications Profit From Widespread Adoption Of Analog Devices Processors 11/11/2008
   The industry’s broadest portfolio of embedded and signal processing choices is what increasingly attracts industrial application developers to technologies from Analog Devices, Inc.
9. Tokyo Electron (TEL) Introduces A Dual Purpose 300mm Dicing Frame Prober 11/4/2008
   Tokyo Electron, Ltd. (TEL) today unveiled the company’s new 300mm Dicing Frame Prober, the WDF 12DP. Designed to address the increasing demand for probing of ultra thin and diced wafers, the system can also be used as a standard wafer prober
10. Agilent Technologies Introduces Industry's First Device Analyzer With Curve Tracer Functionality For Power-Device Evaluation 11/3/2008
    Agilent Technologies Inc. today introduced the industry’s first power device analyzer/curve tracer able to characterize semiconductor devices at up to 3,000 volts and 20 amps in a single box solution