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CRFS Selects XJTAG Boundary Scan To Speed Development Of RFeye Spectrum Monitoring System
8/28/2008
CRFS (Cambridge Radio Frequency Services), a developer and manufacturer of innovative real-time spectral analysis tools, has selected the XJTAG boundary scan development system to debug, test and programme its RFeye™ real-time spectrum monitoring system
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Suzhou IC Design & Engineering Test Center Adopts Verigy V93000 To Support Local Fabless Design Houses
8/25/2008
Verigy, a leading semiconductor test company, today announced that Suzhou CAS (Chinese Academy of Science) Integrated Circuit Design Center (SZICC), a full-service IC design, test and training facility, has purchased a Verigy V93000 SoC tester
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NetQuest Launches First 10 Gigabit Test And Monitoring Access Solution To Optimize Tool Port Usage For Service Providers
8/19/2008
Net Quest, a leading manufacturer of test and monitoring access solutions, today announced the launch of the first 10 Gigagbit access tool for high-speed Packet over SONET/SDH (POS) networks
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SensorTran And Micron Optics To Offer Integrated Fiber Optic Sensing System
8/18/2008
SensorTran today announced a cooperative agreement with Micron Optics, Inc. to offer the world’s first integrated, hybrid fiber optic sensing solution. The new system offers both Distributed Temperature Sensing (DTS) capabilities and Fiber-Bragg Grating (FBG) point sensing capabilities, which measure pressure, strain and vibration
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Digital Lightwave Announces Multi-Service Analyzer, Single Module For Advanced Telecom And Datacom Testing
8/18/2008
Digital Lightwave®, Inc., a leading provider of optical networking test equipment and technology, today announced the MSA 2020 Module for the NIC Platform. The new Multi-Service Analyzer module provides a broad range of testing capability in a single module
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MRV Announces All Optical 100 Gbps Cross Connect For Test Lab Automation
8/13/2008
MRV COMMUNICATIONS, INC., a leading provider of products and services for out-of-band networking, optical transport, metro Ethernet, and fiber optic components today announced the Optical Cross Connect 320 (OCC 320), a new high data-rate, all optical physical layer switch as the latest member of its family of test automation products (TAP) for automating network equipment test environments
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Data Translation Lowers Entry Price For High Accuracy Temperature Measurement Instruments
7/31/2008
Data Translation announces lower cost versions of its popular TEMPpoint™ temperature measurement instrument. TEMPpoint now offers customers an 8-channel entry level version that can be easily extended to 16, 24, 32, 40, or 48 channels over time. This modularity allows customers to upgrade their system as needed while keeping their entry-level costs low
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Ixia And QualiSystems Integrate To Advance IP Test Automation
7/29/2008
Ixia™, a leading global provider of IP performance test systems today announced that it has formed a strategic partnership with QualiSystems, a pioneer in the field of Test Automation, to integrate Ixia’s Test Conductor™ IP test automation framework with QualiSystems’ TestShell™ suite of vendor independent test applications
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Teradyne Introduces The IP750Ex For Image Sensor Device Test
7/28/2008
Teradyne, Inc. announced that Hynix Semiconductor, Inc., Icheon-si, Kyoungki-do Korea, has launched the production of their first CMOS image sensor using the new Teradyne IP750Ex™ test system for wafer testing
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UTAC Selects Teradyne As The Platform Of Choice For Leading Edge Wireless Device Test
7/27/2008
Teradyne, Inc. announced that United Test and Assembly Center (UTAC) of Singapore has selected the UltraFLEX test system with Teradyne’s wireless instrumentation as the platform of choice for testing WLAN, cellular and Bluetooth devices