Business Wire

  1. Agilent Technologies Introduces Industry-First End-To-End DigRF V4 Measurement Solution For Mobile Handset Design 10/1/2008
    Agilent Technologies Inc. today announced the industry’s first Digital Radio Frequency (DigRF) V4 test solution. It enables comprehensive stimulus and analysis for developers of radio-frequency integrated circuits (RF-IC) and baseband ICs (BB-IC) as well as integrators of wireless handsets
  2. Ixia Demonstrates Industry-First 40 Gigabit Ethernet Testing Capability 9/29/2008
    Ixia, today announced that it will demonstrate 40 Gigabit Ethernet (GE) line-rate traffic generation and analysis Sept. 30-Oct. 2 at Broadband World Forum Europe in Brussels (stand #568)
  3. Intellitech Adds Support For The Freescale DSP56F80X Family's On-Chip Programming And Voltage Measurement 9/29/2008
    Intellitech Corporation, has announced that it has added support for the Freescale Semiconductor DSP56F80X family to its SystemBIST device, UltraTAP pod and PT100 concurrent testers used in volume manufacturing
  4. Quantum Data 882E Test Instrument Approved For HDMI-HDCP Compliance Testing 9/24/2008
    Quantum Data, today announced that their 882E-based HDCP compliance test application for the HDMI™ interface has been approved by Digital Content Protection (DCP), LLC as an authorized test tool
  5. Agilent Technologies Announces HiSIM_HV Model Extraction Package For IC-CAP 9/22/2008
    Agilent Technologies Inc. today announced the release of the HiSIM_HV Model Extraction Package for advanced high voltage metal oxide semiconductor (HVMOS) device models
  6. Eagle Test Systems Selects Camstar's Enterprise Manufacturing And Quality Execution Platform 9/18/2008
    Camstar Systems, Inc., today announced that Eagle Test Systems, Inc. (Nasdaq: EGLT), a provider of automated test equipment solutions for high-performance analog, mixed-signal and radio frequency (RF) semiconductors, has selected Camstar’s Electronics Suite to increase visibility and traceability across manufacturing processes and to support yield and quality improvements
  7. Agilent Technologies' All-In-One MIPI D-PHY Test Platform Selected By ST Microelectronics 9/17/2008
    Agilent Technologies Inc. today announced that ST Microelectronics has selected Agilent’s physical layer sink test solution to test its devices according to the MIPI D-PHY standard
  8. Semilab Licenses Implant And Metal Thickness Metrology Technology From Applied Materials 9/17/2008
    Semilab Co. Ltd., announced today that it has licensed key patents and transferred relevant know-how from Applied Materials, Inc. The acquired intellectual property (IP) covers technology and systems used in semiconductor applications for measuring implant and metal thickness
  9. LeCroy Introduces New WaveAce Oscilloscopes For Simple, Fast And Efficient Debug 9/15/2008
    Leroy Corporation introduces the WaveAce series of digital oscilloscopes that expands its line of portable, affordable and easy to use oscilloscopes in the 60 MHz to 300 MHz range
  10. Intellitech Speeds Concurrent Test Of JTAG Based Electronics With New Mercury Remote Diagnostic Manager 9/9/2008
    Intellitech Corporation, has announced the Mercury Remote Diagnostic Manager (MRDM) for production or burn-in test. The MRDM increases tester throughput by enabling the tester to perform back-to-back testing without the need to stop to perform diagnostics on failing UUTs